Abstract
The trapping parameters of one of the carrier traps in low-density polyethylene were evaluated by using the X-ray-induced thermally-stimulated current (TSC) technique. The values obtained were E t (trap depth): 0.90 eV, µτ (product of mobility and lifetime): 5×10-13 m2/V and n to (initial density of trapped carriers): 2.9×1020 m-3. Assuming the fast retrapping case, N t (trap density) was 1.4×1021 m-3 and, assuming the slow retrapping case, S t (capture cross-section) and ν (attempt-to-escape frequency) were 1.1×10-17 m2 and 3×1013 sec-1, respectively. Whether the retrapping was fast or slow, was not determined from the TSC results only.
References
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(1979)
Dates
Type | When |
---|---|
Created | 19 years, 9 months ago (Nov. 4, 2005, 1:13 a.m.) |
Deposited | 2 years, 9 months ago (Nov. 29, 2022, 4:46 a.m.) |
Indexed | 6 months, 1 week ago (Feb. 21, 2025, 5:36 a.m.) |
Issued | 42 years, 10 months ago (Nov. 1, 1982) |
Published | 42 years, 10 months ago (Nov. 1, 1982) |
Published Print | 42 years, 10 months ago (Nov. 1, 1982) |
@article{Mizutani_1982, title={Determination of Trapping Parameters from TSC in Polyethylene}, volume={21}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.21.1639}, DOI={10.1143/jjap.21.1639}, number={11R}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Mizutani, Teruyoshi and Suzuoki, Yasuo and Hanai, Masahiro and Ieda, Masayuki}, year={1982}, month=nov, pages={1639} }