DOI: 10.1143/jjap.19.l735. Scattering Suppression and High-Mobility Effect of Size-Quantized Electrons in Ultrafine Semiconductor Wire Structures

Scattering Suppression and High-Mobility Effect of Size-Quantized Electrons in Ultrafine Semiconductor Wire Structures

10.1143/jjap.19.l735

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Bibliography

Sakaki, H. (1980). Scattering Suppression and High-Mobility Effect of Size-Quantized Electrons in Ultrafine Semiconductor Wire Structures. Japanese Journal of Applied Physics, 19(12), L735âL738.

Authors 1

Hiroyuki Sakaki (first)

References 0 Referenced 850

None

Dates

Type	When
Created	19 years, 9 months ago (Nov. 4, 2005, 1:26 a.m.)
Deposited	5 years, 2 months ago (May 31, 2020, 7:22 p.m.)
Indexed	2 months, 3 weeks ago (May 30, 2025, 1:43 a.m.)
Issued	44 years, 8 months ago (Dec. 1, 1980)
Published	44 years, 8 months ago (Dec. 1, 1980)
Published Print	44 years, 8 months ago (Dec. 1, 1980)

Funders 0

None

BibTeX

@article{Sakaki_1980, title={Scattering Suppression and High-Mobility Effect of Size-Quantized Electrons in Ultrafine Semiconductor Wire Structures}, volume={19}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.19.l735}, DOI={10.1143/jjap.19.l735}, number={12}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Sakaki, Hiroyuki}, year={1980}, month=dec, pages={L735–L738} }

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