DOI: 10.1143/jjap.19.1591. Scanning Electron Microscopic Observation of Oxidation-Induced Stacking Faults in Silicon

Scanning Electron Microscopic Observation of Oxidation-Induced Stacking Faults in Silicon

10.1143/jjap.19.1591

Crossref journal-article

IOP Publishing

Japanese Journal of Applied Physics (266)

Bibliography

Kawado, S. (1980). Scanning Electron Microscopic Observation of Oxidation-Induced Stacking Faults in Silicon. Japanese Journal of Applied Physics, 19(9), 1591.

Authors 1

Seiji Kawado (first)

References 22 Referenced 14

{'key': '[1]', 'first-page': '529', 'volume': '52', 'year': '1961', 'journal-title': 'Z. Metallkde.'} / Z. Metallkde. (1961)
10.1149/1.2404374 / J. Electrochem. Soc. (1972)
10.1149/1.2133401 / J. Electrochem. Soc. (1977)
10.1107/S0021889872009513 / J. Appl. Crystallogr. (1972)
10.1143/JJAP.11.197 / Jpn. J. Appl. Phys. (1972)
10.1002/pssa.2210420247 / Phys. Status Solidi (a) (1977)
10.1080/14786436608211988 / Philos. Mag. (1966)
10.1063/1.1754414 / Appl. Phys. Lett. (1966)
10.1149/1.2403495 / J. Electrochem. Soc. (1973)
10.1063/1.1662972 / J. Appl. Phys. (1974)
10.1143/JJAP.14.407 / Jpn. J. Appl. Phys. (1975)
{'key': '[12]', 'first-page': '19', 'volume': '52', 'year': '1978', 'journal-title': 'Optik'} / Optik (1978)
{'year': '1979', 'key': '[13]'} (1979)
{'year': '1975', 'key': '[14]'} (1975)
10.1063/1.323377 / J. Appl. Phys. (1977)
10.1063/1.326336 / J. Appl. Phys. (1979)
10.1063/1.89355 / Appl. Phys. Lett. (1977)
10.1063/1.1660019 / J. Appl. Phys. (1971)
10.1088/0022-3727/5/1/308 / J. Phys. D (1972)
{'year': '1980', 'key': '[20]'} (1980)
10.1143/JJAP.15.917 / Jpn. J. Appl. Phys. (1976)
10.1080/14786437408207260 / Philos. Mag. (1974)

Dates

Type	When
Created	19 years, 10 months ago (Nov. 4, 2005, 1:24 a.m.)
Deposited	1 year, 8 months ago (Dec. 6, 2023, 11:31 a.m.)
Indexed	2 months, 2 weeks ago (June 16, 2025, 8:08 a.m.)
Issued	45 years ago (Sept. 1, 1980)
Published	45 years ago (Sept. 1, 1980)
Published Print	45 years ago (Sept. 1, 1980)

Funders 0

None

BibTeX

@article{Kawado_1980, title={Scanning Electron Microscopic Observation of Oxidation-Induced Stacking Faults in Silicon}, volume={19}, ISSN={1347-4065}, url={http://dx.doi.org/10.1143/jjap.19.1591}, DOI={10.1143/jjap.19.1591}, number={9}, journal={Japanese Journal of Applied Physics}, publisher={IOP Publishing}, author={Kawado, Seiji}, year={1980}, month=sep, pages={1591} }

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