DOI: 10.1142/s0218625x9700122x. ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION

ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION

10.1142/s0218625x9700122x

Crossref journal-article

World Scientific Pub Co Pte Lt

Surface Review and Letters (219)

Abstract

In this note we report the first observation of salient features of the Si(111)(7×7) reconstructed surface across monatomic steps by dynamic atomic force microscopy (AFM) in ultrahigh vacuum (UHV). Simultaneous measurements of the resonance frequency shift Δf of the Si cantilever and of the mean tunneling current [Formula: see text] from the cleaned Si tip indicate a restricted range for stable imaging with true atomic resolution. The corresponding characteristics vs. distance reveal why feedback control via Δf is problematic, whereas it is as successful as in conventional STM via [Formula: see text]. Furthermore, local dissipation (energy loss of 10-14 W) through individual atoms is observed and explained by the coupling of the surface atoms to phonons.

Bibliography

LÃTHI, R., MEYER, E., BAMMERLIN, M., BARATOFF, A., HOWALD, L., GERBER, CH., & GÃNTHERODT, H.-J. (1997). ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION. Surface Review and Letters, 04(05), 1025â1029.

Authors 7

R. LÜTHI (first)
E. MEYER (additional)
M. BAMMERLIN (additional)
A. BARATOFF (additional)
L. HOWALD (additional)
CH. GERBER (additional)
H.-J. GÜNTHERODT (additional)

References 0 Referenced 50

None

Dates

Type	When
Created	21 years, 8 months ago (Dec. 2, 2003, 11:06 p.m.)
Deposited	6 years ago (Aug. 7, 2019, 8:23 a.m.)
Indexed	3 months, 1 week ago (May 13, 2025, 4:05 a.m.)
Issued	27 years, 10 months ago (Oct. 1, 1997)
Published	27 years, 10 months ago (Oct. 1, 1997)
Published Online	13 years, 7 months ago (Jan. 25, 2012)
Published Print	27 years, 10 months ago (Oct. 1, 1997)

Funders 0

None

BibTeX

@article{L_THI_1997, title={ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION}, volume={04}, ISSN={1793-6667}, url={http://dx.doi.org/10.1142/s0218625x9700122x}, DOI={10.1142/s0218625x9700122x}, number={05}, journal={Surface Review and Letters}, publisher={World Scientific Pub Co Pte Lt}, author={LÜTHI, R. and MEYER, E. and BAMMERLIN, M. and BARATOFF, A. and HOWALD, L. and GERBER, CH. and GÜNTHERODT, H.-J.}, year={1997}, month=oct, pages={1025–1029} }

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