Crossref journal-article
World Scientific Pub Co Pte Lt
Surface Review and Letters (219)
Abstract

Reflection anisotropy spectroscopy (RAS) is a nondestructive surface-sensitive optical probe capable of operation within a wide range of environments. RAS has been applied to semiconductor surfaces and has found use as an in situ monitor of semiconductor growth. Surface sensitivity has been demonstrated with the detection of reconstructions, dimer orientations, and adsorption. More recently, RAS has been used to probe the surface optical properties of metals. In this article, some aspects of the RAS technique are described, including an analysis of the passage of polarized light through the RA spectrometer, which results in frequency-dependent terms related to the real and imaginary RA. A short review of recent applications of RAS is given.

Bibliography

MARTIN, D. S., & WEIGHTMAN, P. (2000). REFLECTION ANISOTROPY SPECTROSCOPY: AN OPTICAL PROBE OF SURFACES AND INTERFACES. Surface Review and Letters, 07(04), 389–397.

Dates
Type When
Created 22 years, 4 months ago (April 22, 2003, 3:57 a.m.)
Deposited 6 years ago (Aug. 6, 2019, 5:54 p.m.)
Indexed 1 year, 11 months ago (Sept. 11, 2023, 6:28 p.m.)
Issued 25 years ago (Aug. 1, 2000)
Published 25 years ago (Aug. 1, 2000)
Published Online 13 years, 7 months ago (Jan. 25, 2012)
Published Print 25 years ago (Aug. 1, 2000)
Funders 0

None

@article{MARTIN_2000, title={REFLECTION ANISOTROPY SPECTROSCOPY: AN OPTICAL PROBE OF SURFACES AND INTERFACES}, volume={07}, ISSN={1793-6667}, url={http://dx.doi.org/10.1142/s0218625x00000506}, DOI={10.1142/s0218625x00000506}, number={04}, journal={Surface Review and Letters}, publisher={World Scientific Pub Co Pte Lt}, author={MARTIN, D. S. and WEIGHTMAN, P.}, year={2000}, month=aug, pages={389–397} }