DOI: 10.1142/s0217984914300117. Nanoscale dielectric measurements from electrostatic force microscopy

Nanoscale dielectric measurements from electrostatic force microscopy

10.1142/s0217984914300117

Crossref journal-article

World Scientific Pub Co Pte Lt

Modern Physics Letters B (219)

Abstract

Electrostatic force microscopy has evolved as a standard tool for electrical characterization of surfaces with high lateral resolution. Key to its success is an accurate and informative model of the cantilever capacitance. In this brief review, we summarize the progress made in the dielectric characterization of surfaces using electrostatic force microscopy and discuss the development of various models to analytically describe the capacitive forces between the cantilever tip and sample. We include a discussion of the recent extension of these measurements to the liquid environment.

Bibliography

Kumar, B., & Crittenden, S. R. (2014). Nanoscale dielectric measurements from electrostatic force microscopy. Modern Physics Letters B, 28(24), 1430011.

Authors 2

Bharat Kumar (first)
Scott R. Crittenden (additional)

References 64 Referenced 6

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Dates

Type	When
Created	10 years, 11 months ago (Sept. 21, 2014, 9:59 p.m.)
Deposited	6 years ago (Aug. 6, 2019, 9:22 p.m.)
Indexed	5 months ago (March 22, 2025, 5:55 a.m.)
Issued	10 years, 11 months ago (Sept. 20, 2014)
Published	10 years, 11 months ago (Sept. 20, 2014)
Published Online	10 years, 11 months ago (Sept. 21, 2014)
Published Print	10 years, 11 months ago (Sept. 20, 2014)

Funders 0

None

BibTeX

@article{Kumar_2014, title={Nanoscale dielectric measurements from electrostatic force microscopy}, volume={28}, ISSN={1793-6640}, url={http://dx.doi.org/10.1142/s0217984914300117}, DOI={10.1142/s0217984914300117}, number={24}, journal={Modern Physics Letters B}, publisher={World Scientific Pub Co Pte Lt}, author={Kumar, Bharat and Crittenden, Scott R.}, year={2014}, month=sep, pages={1430011} }

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