Abstract
We have developed a method for the reproducible fabrication of superconducting scanning tunneling microscope (STM) tips. We use these tips to form superconductor/insulator/superconductor tunnel junctions with the STM tip as one of the electrodes. We show that such junctions exhibit fluctuation dominated Josephson effects, and describe how the Josephson product IcRN can be inferred from the junctions' tunneling characteristics in this regime. This is first demonstrated for tunneling into Pb films, and then applied in studies of single crystals of NbSe 2. We find that in NbSe 2, IcRN is lower than expected, which could be attributed to the interplay between superconductivity and the coexisting charge density wave in this material.
References
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Dates
Type | When |
---|---|
Created | 21 years, 11 months ago (Sept. 16, 2003, 2:12 a.m.) |
Deposited | 6 years ago (Aug. 6, 2019, 4:43 p.m.) |
Indexed | 1 year, 8 months ago (Dec. 27, 2023, 3:37 p.m.) |
Issued | 22 years ago (Aug. 10, 2003) |
Published | 22 years ago (Aug. 10, 2003) |
Published Online | 13 years, 7 months ago (Jan. 25, 2012) |
Published Print | 22 years ago (Aug. 10, 2003) |
@article{Naaman_2003, title={Josephson Effect in <font>Pb/I/NbSe</font>2 Scanning Tunneling Microscope Junctions}, volume={17}, ISSN={1793-6578}, url={http://dx.doi.org/10.1142/s0217979203021423}, DOI={10.1142/s0217979203021423}, number={18n20}, journal={International Journal of Modern Physics B}, publisher={World Scientific Pub Co Pte Lt}, author={Naaman, O. and Dynes, R. C. and Bucher, E.}, year={2003}, month=aug, pages={3569–3574} }