DOI: 10.1137/07068326x. Local Tomography in Electron Microscopy

10.1137/07068326x

Crossref journal-article

Society for Industrial & Applied Mathematics (SIAM)

SIAM Journal on Applied Mathematics (351)

Bibliography

Quinto, E. T., & Ãktem, O. (2008). Local Tomography in Electron Microscopy. SIAM Journal on Applied Mathematics, 68(5), 1282â1303.

Authors 2

Eric Todd Quinto (first)
Ozan Öktem (additional)

References 23 Referenced 33

10.1364/JOSAA.24.001569
10.1090/S0002-9947-1993-1080733-8
10.1038/217130a0
10.1088/0266-5611/24/1/013001
10.1137/S0036139995286357
10.1137/0152026
10.1215/S0012-7094-89-05811-0
10.1007/BF00600449
10.1007/BF02392052
10.1137/S0036139998336043
10.1088/0266-5611/22/2/015
10.1088/0266-5611/11/3/006
10.1109/42.251129
10.1137/0524069
10.1016/j.cam.2004.11.055
10.1016/j.str.2004.02.011
{'key': 'R25', 'first-page': '59', 'volume': '2', 'author': 'Semyanistyi V. I.', 'year': '1961', 'journal-title': 'Soviet Math. Dokl.', 'ISSN': 'http://id.crossref.org/issn/0197-6788', 'issn-type': 'print'} / Soviet Math. Dokl. by Semyanistyi V. I. (1961)
10.1056/NEJMra052131
{'key': 'R28', 'first-page': '415', 'volume': '17', 'author': 'Vainberg E. I.', 'year': '1981', 'journal-title': 'Soviet J. Nondestructive Testing', 'ISSN': 'http://id.crossref.org/issn/0038-5492', 'issn-type': 'print'} / Soviet J. Nondestructive Testing by Vainberg E. I. (1981)
{'key': 'R29', 'first-page': '838', 'volume': '13', 'author': 'Vainshtein B. K.', 'year': '1969', 'journal-title': 'Dokl. Akad. Nauk SSSR, 182 (1968), pp. 569–572 (in Russian); Soviet Phys. Dokl.'} / Dokl. Akad. Nauk SSSR, 182 (1968), pp. 569–572 (in Russian); Soviet Phys. Dokl. by Vainshtein B. K. (1969)
10.1172/JCI22562
10.1088/0266-5611/23/1/010
10.1002/(SICI)1097-0029(20000501)49:3<245::AID-JEMT4>3.0.CO;2-O

Dates

Type	When
Created	17 years, 4 months ago (April 9, 2008, 2:03 p.m.)
Deposited	8 years, 6 months ago (Jan. 29, 2017, 2:39 a.m.)
Indexed	3 months, 1 week ago (May 13, 2025, 3:05 a.m.)
Issued	17 years, 7 months ago (Jan. 1, 2008)
Published	17 years, 7 months ago (Jan. 1, 2008)
Published Print	17 years, 7 months ago (Jan. 1, 2008)

Funders 0

None

BibTeX

@article{Quinto_2008, title={Local Tomography in Electron Microscopy}, volume={68}, ISSN={1095-712X}, url={http://dx.doi.org/10.1137/07068326x}, DOI={10.1137/07068326x}, number={5}, journal={SIAM Journal on Applied Mathematics}, publisher={Society for Industrial & Applied Mathematics (SIAM)}, author={Quinto, Eric Todd and Öktem, Ozan}, year={2008}, month=jan, pages={1282–1303} }

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