DOI: 10.1126/science.aaa2433. Nanoscale temperature mapping in operating microelectronic devices

Nanoscale temperature mapping in operating microelectronic devices

10.1126/science.aaa2433

Crossref journal-article

American Association for the Advancement of Science (AAAS)

Science (221)

Abstract

Plasmons can map temperature on the nanoscale Determining temperature on small length scales can be challenging: Direct probes can alter sample temperature, and radiation probes are limited by the wavelength of the light used. Mecklenberg et al. show how the bulk plasmon resonance of aluminum can be used to map the temperature on the nanoscale with transmission electron microscopy (see the Perspective by Colliex). Many other metals and semiconductors also have plasmon resonances that could also be used for temperature imaging. Science , this issue p. 629 ; see also p. 611

Bibliography

Mecklenburg, M., Hubbard, W. A., White, E. R., Dhall, R., Cronin, S. B., Aloni, S., & Regan, B. C. (2015). Nanoscale temperature mapping in operating microelectronic devices. Science, 347(6222), 629â632.

Authors 7

Matthew Mecklenburg (first)
William A. Hubbard (additional)
E. R. White (additional)
Rohan Dhall (additional)
Stephen B. Cronin (additional)
Shaul Aloni (additional)
B. C. Regan (additional)

References 31 Referenced 292

F. Reif Fundamentals of Statistical and Thermal Physics (McGraw-Hill New York 1965).
10.1103/PhysRevLett.93.080402
10.1103/RevModPhys.83.131
10.1115/1.2993145
10.1039/c2nr30663h
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10.1103/PhysRevLett.102.105501
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10.1038/nature12373
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10.1080/108939597200241
10.1038/nature12568
10.1088/0957-4484/23/46/465707
10.1016/j.ultramic.2013.04.004
Abe H., Terauchi M., Kuzuo R., Tanaka M., J. Electron Microsc. (Tokyo) 41, 465 (1992). / J. Electron Microsc. (Tokyo) by Abe H. (1992)
10.1007/BF01327367
10.1063/1.3609063
10.1088/0959-5309/53/3/305
10.1103/PhysRevLett.108.055504
10.1021/la2048486
10.1088/0034-4885/72/1/016502
10.1038/nature13870
K. A. Gschneidner Solid State Physics Frederick Seitz David Turnbull Eds. (Academic Press 1964) vol. 16 pp. 275–426. (10.1016/S0081-1947(08)60518-4)
C. Kittel Introduction to Solid State Physics (Wiley Hoboken NJ 2005) 8th edn.
J. M. Ziman Electrons and Phonons: The Theory of Transport Phenomena in Solids (Clarendon Press Oxford 1960).

Dates

Type	When
Created	10 years, 6 months ago (Feb. 5, 2015, 2:09 p.m.)
Deposited	1 year, 7 months ago (Jan. 15, 2024, 12:10 p.m.)
Indexed	1 week ago (Aug. 26, 2025, 2:59 a.m.)
Issued	10 years, 6 months ago (Feb. 6, 2015)
Published	10 years, 6 months ago (Feb. 6, 2015)
Published Print	10 years, 6 months ago (Feb. 6, 2015)

Funders 1

National Science Foundation 10.13039/100000001
Region: Americas
gov (National government)
Labels4
1. U.S. National Science Foundation
2. NSF
3. US NSF
4. USA NSF
Awards1
1. DMR-1206849

BibTeX

@article{Mecklenburg_2015, title={Nanoscale temperature mapping in operating microelectronic devices}, volume={347}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.aaa2433}, DOI={10.1126/science.aaa2433}, number={6222}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Mecklenburg, Matthew and Hubbard, William A. and White, E. R. and Dhall, Rohan and Cronin, Stephen B. and Aloni, Shaul and Regan, B. C.}, year={2015}, month=feb, pages={629–632} }

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