DOI: 10.1126/science.272.5270.1921. Off-Resonance Conduction Through Atomic Wires

Off-Resonance Conduction Through Atomic Wires

10.1126/science.272.5270.1921

Crossref journal-article

American Association for the Advancement of Science (AAAS)

Science (221)

Abstract

The electrical resistance of wires consisting of either a single xenon atom or two xenon atoms in series was measured and calculated on the basis of an atom-jellium model. Both the measurement and the calculation yielded a resistance of 10 5 ohms for the single-xenon atom system and 10 7 ohms for the two-xenon atom system. These resistances greatly exceeded the 12,900-ohm resistance of an ideal one-dimensional conduction channel because conduction through the xenon atoms occurs through the tail of the xenon 6 s resonance, which lies far above the Fermi level. This conduction process in an atom-sized system can now be understood in terms of the electronic states of individual atoms.

Bibliography

Yazdani, A., Eigler, D. M., & Lang, N. D. (1996). Off-Resonance Conduction Through Atomic Wires. Science, 272(5270), 1921â1924.

Authors 3

Ali Yazdani (first)
D. M. Eigler (additional)
N. D. Lang (additional)

References 24 Referenced 207

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BEENAKKER CWJ, QUANTUM TRANSPORT IN SEMICONDUCTOR NANOSTRUCTURES, SOLID STATE PHYSICS-ADVANCES IN RESEARCH AND APPLICATIONS 44, 1 (1991). / SOLID STATE PHYSICS-ADVANCES IN RESEARCH AND APPLICATIONS / QUANTUM TRANSPORT IN SEMICONDUCTOR NANOSTRUCTURES by BEENAKKER CWJ (1991)
BUTTIKER M, COHERENT AND SEQUENTIAL TUNNELING IN SERIES BARRIERS, IBM JOURNAL OF RESEARCH AND DEVELOPMENT 32, 63 (1988). (10.1147/rd.321.0063) / IBM JOURNAL OF RESEARCH AND DEVELOPMENT / COHERENT AND SEQUENTIAL TUNNELING IN SERIES BARRIERS by BUTTIKER M (1988)
EIGLER D.M., POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE, NATURE 344, 524 (1990). (10.1038/344524a0) / NATURE / POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE by EIGLER D.M. (1990)
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EIGLER D.M., IMAGING XE WITH A LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE, PHYSICAL REVIEW LETTERS 66, 1189 (1991). (10.1103/PhysRevLett.66.1189) / PHYSICAL REVIEW LETTERS / IMAGING XE WITH A LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE by EIGLER D.M. (1991)
EIGLER D.M. unpublished data.
GIMZEWSKI J.K., TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY, PHYSICAL REVIEW B 36, 1284 (1987). (10.1103/PhysRevB.36.1284) / PHYSICAL REVIEW B / TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY by GIMZEWSKI J.K. (1987)
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Dates

Type	When
Created	18 years, 9 months ago (Oct. 27, 2006, 2:30 p.m.)
Deposited	1 year, 7 months ago (Jan. 12, 2024, 10:03 p.m.)
Indexed	1 year ago (Aug. 10, 2024, 7:51 a.m.)
Issued	29 years, 1 month ago (June 28, 1996)
Published	29 years, 1 month ago (June 28, 1996)
Published Print	29 years, 1 month ago (June 28, 1996)

Funders 0

None

BibTeX

@article{Yazdani_1996, title={Off-Resonance Conduction Through Atomic Wires}, volume={272}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.272.5270.1921}, DOI={10.1126/science.272.5270.1921}, number={5270}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Yazdani, Ali and Eigler, D. M. and Lang, N. D.}, year={1996}, month=jun, pages={1921–1924} }

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