DOI: 10.1126/science.270.5242.1646. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

10.1126/science.270.5242.1646

Crossref journal-article

American Association for the Advancement of Science (AAAS)

Science (221)

Abstract

With an atomic force microscope operating in the noncontact mode in an ultrahigh vacuum, atomic-resolution imaging of the cleaved semi-insulating InP(110) surface has been achieved. By this method, atomic scale point defects and their motion were observed at room temperature, without the field-induced effects associated with scanning tunneling microscopy.

Bibliography

Sugawara, Y., Ohta, M., Ueyama, H., & Morita, S. (1995). Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy. Science, 270(5242), 1646â1648.

Authors 4

Yasuhiro Sugawara (first)
Masahiro Ohta (additional)
Hitoshi Ueyama (additional)
Seizo Morita (additional)

References 15 Referenced 301

ALBRECHT T.R., FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY, JOURNAL OF APPLIED PHYSICS 69, 668 (1991). (10.1063/1.347347) / JOURNAL OF APPLIED PHYSICS / FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY by ALBRECHT T.R. (1991)
10.1103/PhysRevLett.56.930
EBERT P, SCANNING-TUNNELING-MICROSCOPE TIP-INDUCED MIGRATION OF VACANCIES ON GAP(110), PHYSICAL REVIEW LETTERS 70, 1437 (1993). (10.1103/PhysRevLett.70.1437) / PHYSICAL REVIEW LETTERS / SCANNING-TUNNELING-MICROSCOPE TIP-INDUCED MIGRATION OF VACANCIES ON GAP(110) by EBERT P (1993)
EBERT P, CHARGE-STATE-DEPENDENT STRUCTURAL RELAXATION AROUND ANION VACANCIES ON INP(110) AND GAP(110) SURFACES, PHYSICAL REVIEW LETTERS 72, 840 (1994). (10.1103/PhysRevLett.72.840) / PHYSICAL REVIEW LETTERS / CHARGE-STATE-DEPENDENT STRUCTURAL RELAXATION AROUND ANION VACANCIES ON INP(110) AND GAP(110) SURFACES by EBERT P (1994)
EBERT P, A STM STUDY OF THE INP (110) SURFACE, ULTRAMICROSCOPY 42, 871 (1992). (10.1016/0304-3991(92)90371-P) / ULTRAMICROSCOPY / A STM STUDY OF THE INP (110) SURFACE by EBERT P (1992)
EIGLER D.M., POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE, NATURE 344, 524 (1990). (10.1038/344524a0) / NATURE / POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE by EIGLER D.M. (1990)
10.1126/science.267.5194.68
KITAMURA S, OBSERVATION OF 7X7 RECONSTRUCTED STRUCTURE ON THE SILICON (111) SURFACE USING ULTRAHIGH-VACUUM NONCONTACT ATOMIC-FORCE MICROSCOPY, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS 34, L145 (1995). (10.1143/JJAP.34.L145) / JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS / OBSERVATION OF 7X7 RECONSTRUCTED STRUCTURE ON THE SILICON (111) SURFACE USING ULTRAHIGH-VACUUM NONCONTACT ATOMIC-FORCE MICROSCOPY by KITAMURA S (1995)
LENGEL G, INTERCHAIN VACANCY MIGRATION OF GAAS(110), JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS 12, 1855 (1994). (10.1116/1.579017) / JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS / INTERCHAIN VACANCY MIGRATION OF GAAS(110) by LENGEL G (1994)
10.1126/science.253.5016.173
MEYER R.J., DYNAMICAL ANALYSIS OF LOW-ENERGY-ELECTRON DIFFRACTION INTENSITIES FROM INP (110), PHYSICAL REVIEW B 22, 6171 (1980). (10.1103/PhysRevB.22.6171) / PHYSICAL REVIEW B / DYNAMICAL ANALYSIS OF LOW-ENERGY-ELECTRON DIFFRACTION INTENSITIES FROM INP (110) by MEYER R.J. (1980)
OHTA M, ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE WITH SAMPLE CLEAVING MECHANISM, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 12, 1705 (1994). (10.1116/1.587581) / JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B / ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE WITH SAMPLE CLEAVING MECHANISM by OHTA M (1994)
OHTA M, ATOMICALLY RESOLVED IMAGE OF CLEAVED SURFACES OF COMPOUND SEMICONDUCTORS OBSERVED WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 13, 1265 (1995). (10.1116/1.587835) / JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B / ATOMICALLY RESOLVED IMAGE OF CLEAVED SURFACES OF COMPOUND SEMICONDUCTORS OBSERVED WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE by OHTA M (1995)
RUGAR D, IMPROVED FIBER-OPTIC INTERFEROMETER FOR ATOMIC FORCE MICROSCOPY, APPLIED PHYSICS LETTERS 55, 2588 (1989). (10.1063/1.101987) / APPLIED PHYSICS LETTERS / IMPROVED FIBER-OPTIC INTERFEROMETER FOR ATOMIC FORCE MICROSCOPY by RUGAR D (1989)
WHITMAN L.J., MANIPULATION OF ADSORBED ATOMS AND CREATION OF NEW STRUCTURES ON ROOM-TEMPERATURE SURFACES WITH A SCANNING TUNNELING MICROSCOPE, SCIENCE 251, 1206 (1991). (10.1126/science.251.4998.1206) / SCIENCE / MANIPULATION OF ADSORBED ATOMS AND CREATION OF NEW STRUCTURES ON ROOM-TEMPERATURE SURFACES WITH A SCANNING TUNNELING MICROSCOPE by WHITMAN L.J. (1991)

Dates

Type	When
Created	18 years, 10 months ago (Oct. 27, 2006, 2:19 p.m.)
Deposited	1 year, 7 months ago (Jan. 12, 2024, 4:38 p.m.)
Indexed	2 days, 14 hours ago (Aug. 27, 2025, 12:10 p.m.)
Issued	29 years, 8 months ago (Dec. 8, 1995)
Published	29 years, 8 months ago (Dec. 8, 1995)
Published Print	29 years, 8 months ago (Dec. 8, 1995)

Funders 0

None

BibTeX

@article{Sugawara_1995, title={Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy}, volume={270}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.270.5242.1646}, DOI={10.1126/science.270.5242.1646}, number={5242}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Sugawara, Yasuhiro and Ohta, Masahiro and Ueyama, Hitoshi and Morita, Seizo}, year={1995}, month=dec, pages={1646–1648} }

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