Abstract
Interferometric near-field optical microscopy achieving a resolution of 10 angstroms is demonstrated. The scattered electric field variation caused by a vibrating probe tip in close proximity to a sample surface is measured by encoding it as a modulation in the optical phase of one arm of an interferometer. Unlike in regular near-field optical microscopes, where the contrast results from a weak source (or aperture) dipole interacting with the polarizability of the sample, the present form of imaging relies on a fundamentally different contrast mechanism: sensing the dipole-dipole coupling of two externally driven dipoles (the tip and sample dipoles) as their spacing is modulated.
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Dates
Type | When |
---|---|
Created | 18 years, 10 months ago (Oct. 27, 2006, 2:19 p.m.) |
Deposited | 1 year, 7 months ago (Jan. 12, 2024, 6:45 p.m.) |
Indexed | 5 days, 4 hours ago (Aug. 27, 2025, 11:38 a.m.) |
Issued | 30 years ago (Aug. 25, 1995) |
Published | 30 years ago (Aug. 25, 1995) |
Published Print | 30 years ago (Aug. 25, 1995) |
@article{Zenhausern_1995, title={Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution}, volume={269}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.269.5227.1083}, DOI={10.1126/science.269.5227.1083}, number={5227}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Zenhausern, F. and Martin, Y. and Wickramasinghe, H. K.}, year={1995}, month=aug, pages={1083–1085} }