Crossref journal-article
American Association for the Advancement of Science (AAAS)
Science (221)
Abstract

Interferometric near-field optical microscopy achieving a resolution of 10 angstroms is demonstrated. The scattered electric field variation caused by a vibrating probe tip in close proximity to a sample surface is measured by encoding it as a modulation in the optical phase of one arm of an interferometer. Unlike in regular near-field optical microscopes, where the contrast results from a weak source (or aperture) dipole interacting with the polarizability of the sample, the present form of imaging relies on a fundamentally different contrast mechanism: sensing the dipole-dipole coupling of two externally driven dipoles (the tip and sample dipoles) as their spacing is modulated.

Bibliography

Zenhausern, F., Martin, Y., & Wickramasinghe, H. K. (1995). Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution. Science, 269(5227), 1083–1085.

Authors 3
  1. F. Zenhausern (first)
  2. Y. Martin (additional)
  3. H. K. Wickramasinghe (additional)
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Dates
Type When
Created 18 years, 10 months ago (Oct. 27, 2006, 2:19 p.m.)
Deposited 1 year, 7 months ago (Jan. 12, 2024, 6:45 p.m.)
Indexed 5 days, 4 hours ago (Aug. 27, 2025, 11:38 a.m.)
Issued 30 years ago (Aug. 25, 1995)
Published 30 years ago (Aug. 25, 1995)
Published Print 30 years ago (Aug. 25, 1995)
Funders 0

None

@article{Zenhausern_1995, title={Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution}, volume={269}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.269.5227.1083}, DOI={10.1126/science.269.5227.1083}, number={5227}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Zenhausern, F. and Martin, Y. and Wickramasinghe, H. K.}, year={1995}, month=aug, pages={1083–1085} }