DOI: 10.1126/science.267.5194.68. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

10.1126/science.267.5194.68

Crossref journal-article

American Association for the Advancement of Science (AAAS)

Science (221)

Abstract

Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficult for reactive surfaces, where the interaction forces between the tip and the samples can be relatively large. A force detection scheme that makes use of a modified cantilever beam and senses the force gradient through frequency modulation is described. The reconstructed silicon (111)-(7×7) surface was imaged in a noncontact mode by force microscopy with atomic resolution (6 angstroms lateral, 0.1 angstrom vertical).

Bibliography

Giessibl, F. J. (1995). Atomic Resolution of the Silicon (111)-(7Ã7) Surface by Atomic Force Microscopy. Science, 267(5194), 68â71.

Authors 1

Franz J. Giessibl (first)

References 15 Referenced 1,029

ALBRECHT, T.R., FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY, JOURNAL OF APPLIED PHYSICS 69: 668 (1991). (10.1063/1.347347) / JOURNAL OF APPLIED PHYSICS (1991)
BINNIG, G, 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE, PHYSICAL REVIEW LETTERS 50: 120 (1983). (10.1103/PhysRevLett.50.120) / PHYSICAL REVIEW LETTERS (1983)
BINNIG, G, ATOMIC FORCE MICROSCOPE, PHYSICAL REVIEW LETTERS 56: 930 (1986). (10.1103/PhysRevLett.56.930) / PHYSICAL REVIEW LETTERS (1986)
DURIG, U, MAPPING OF SHORT-RANGE ADHESIVE FORCES BY SCANNING-TUNNELING-MICROSCOPY, PHYSICAL REVIEW B 50: 5008 (1994). (10.1103/PhysRevB.50.5008) / PHYSICAL REVIEW B (1994)
DURIG, U, OBSERVATION OF METALLIC ADHESION USING THE SCANNING TUNNELING MICROSCOPE, PHYSICAL REVIEW LETTERS 65: 349 (1990). (10.1103/PhysRevLett.65.349) / PHYSICAL REVIEW LETTERS (1990)
GIESSIBL, F. J., JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 33: 3726 (1994). / JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS (1994)
GIESSIBL, F.J., THEORY FOR AN ELECTROSTATIC IMAGING MECHANISM ALLOWING ATOMIC RESOLUTION OF IONIC-CRYSTALS BY ATOMIC FORCE MICROSCOPY, PHYSICAL REVIEW B 45: 13815 (1992). (10.1103/PhysRevB.45.13815) / PHYSICAL REVIEW B (1992)
GIESSIBL, F.J., PIEZORESISTIVE CANTILEVERS UTILIZED FOR SCANNING TUNNELING AND SCANNING FORCE MICROSCOPE IN ULTRAHIGH-VACUUM, REVIEW OF SCIENTIFIC INSTRUMENTS 65: 1923 (1994). (10.1063/1.1145232) / REVIEW OF SCIENTIFIC INSTRUMENTS (1994)
GIESSIBL, F. J., ULTRAMICROSCOPY 42: 281 (1992). / ULTRAMICROSCOPY (1992)
HOWALD, L, SCANNING FORCE MICROSCOPY ON THE SI(111)7 X 7 SURFACE RECONSTRUCTION, ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER 93: 267 (1994). (10.1007/BF01312696) / ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER (1994)
Kittel, C., Introduction to Solid State Physics: 55 (1986). / Introduction to Solid State Physics (1986)
MEYER, G, OPTICAL-BEAM-DEFLECTION ATOMIC FORCE MICROSCOPY - THE NACL (001) SURFACE, APPLIED PHYSICS LETTERS 56: 2100 (1990). (10.1063/1.102985) / APPLIED PHYSICS LETTERS (1990)
10.1126/science.260.5113.1451
TAKAYANAGI, K, STRUCTURAL-ANALYSIS OF SI(111)-7X7 BY UHV-TRANSMISSION ELECTRON-DIFFRACTION AND MICROSCOPY, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS 3: 1502 (1985). (10.1116/1.573160) / JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS (1985)
TORTONESE, M, ATOMIC RESOLUTION WITH AN ATOMIC FORCE MICROSCOPE USING PIEZORESISTIVE DETECTION, APPLIED PHYSICS LETTERS 62: 834 (1993). (10.1063/1.108593) / APPLIED PHYSICS LETTERS (1993)

Dates

Type	When
Created	18 years, 9 months ago (Oct. 27, 2006, 2:19 p.m.)
Deposited	1 year, 7 months ago (Jan. 12, 2024, 4:14 p.m.)
Indexed	2 weeks, 3 days ago (Aug. 6, 2025, 8:04 a.m.)
Issued	30 years, 7 months ago (Jan. 6, 1995)
Published	30 years, 7 months ago (Jan. 6, 1995)
Published Print	30 years, 7 months ago (Jan. 6, 1995)

Funders 0

None

BibTeX

@article{Giessibl_1995, title={Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy}, volume={267}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.267.5194.68}, DOI={10.1126/science.267.5194.68}, number={5194}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Giessibl, Franz J.}, year={1995}, month=jan, pages={68–71} }

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