Abstract
Multiple-junction structures were formed, on a microscopic scale, at room temperature, by the application of a strong electric field across originally homogeneous crystals of the ternary chalcopyrite semiconductor CuInSe 2 . After removal of the electric field, the structures were examined with electron beam-induced current microscopy and their current-voltage characteristics were measured. Bipolar transistor action was observed, indicating that sharp bulk junctions can form in this way at low ambient temperatures. The devices are stable under normal (low-voltage) operating conditions. Possible causes for this effect, including electromigration and electric field-assisted defect reactions, are suggested.
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Dates
Type | When |
---|---|
Created | 18 years, 10 months ago (Oct. 5, 2006, 7:03 p.m.) |
Deposited | 1 year, 7 months ago (Jan. 12, 2024, 5:32 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 6, 2024, 7:29 p.m.) |
Issued | 32 years, 10 months ago (Oct. 9, 1992) |
Published | 32 years, 10 months ago (Oct. 9, 1992) |
Published Print | 32 years, 10 months ago (Oct. 9, 1992) |
@article{Cahen_1992, title={Room-Temperature, Electric Field-Induced Creation of Stable Devices in CulnSe 2 Crystals}, volume={258}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.258.5080.271}, DOI={10.1126/science.258.5080.271}, number={5080}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Cahen, David and Gilet, Jean-Marc and Schmitz, Claus and Chernyak, Leonid and Gartsman, Konstantin and Jakubowicz, Abram}, year={1992}, month=oct, pages={271–274} }