Crossref journal-article
American Association for the Advancement of Science (AAAS)
Science (221)
Abstract

Using high-resolution imaging at negative spherical aberration of the objective lens in an aberration-corrected transmission electron microscope, we measure the concentration of oxygen in Σ3{111} twin boundaries in BaTiO 3 thin films at atomic resolution. On average, 68% of the boundary oxygen sites are occupied, and the others are left vacant. The modified Ti 2 O 9 group unit thus formed reduces the grain boundary energy and provides a way of accommodating oxygen vacancies occurring in oxygen-deficient material by the formation of a nanotwin lamellae structure. The atomically resolved measurement technique offers the potential for studies on oxide materials in which the electronic properties sensitively depend on the local oxygen content.

Bibliography

Jia, C. L., & Urban, K. (2004). Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials. Science, 303(5666), 2001–2004.

Authors 2
  1. C. L. Jia (first)
  2. K. Urban (additional)
References 39 Referenced 272
  1. N. Setter, R. Waser, Acta Mater.48, 151 (2000). (10.1016/S1359-6454(99)00293-1) / Acta Mater. (2000)
  2. H.-I. Yoo, C.-R. Song, D.-K. Lee, J. Electroceram.8, 5 (2002). (10.1023/A:1015570717935) / J. Electroceram. (2002)
  3. C. P. Poole H. A. Farach R. J. Creswick Superconductivity (Academic Press San Diego CA 1995). (10.1016/B978-0-12-561455-9.50012-4)
  4. Y. Tokura Colossal Magnetoresistive Oxides (Gordon & Breach London 2000). (10.1201/9781482287493)
  5. R. Waser, Integr. Ferroelect.15, 39 (1997). (10.1080/10584589708015695) / Integr. Ferroelect. (1997)
  6. A. K. Tagantsev, I. Stolichnov, E. L. Colla, N. Setter, J. Appl. Phys.90, 1387 (2001). (10.1063/1.1381542) / J. Appl. Phys. (2001)
  7. R. Waser, Solid State Ionics75, 89 (1995). (10.1016/0167-2738(94)00152-I) / Solid State Ionics (1995)
  8. R. F. Klie, Y. Ito, S. Stemmer, D. N. Browning, Ultramicroscopy86, 289 (2001). (10.1016/S0304-3991(00)00120-0) / Ultramicroscopy (2001)
  9. M. Kimet al., Phys. Rev. Lett.86, 4056 (2001). (10.1103/PhysRevLett.86.4056) / Phys. Rev. Lett. (2001)
  10. A. Ourmazd, J. C. H. Spence, Nature329, 425 (1987). (10.1038/329425a0) / Nature (1987)
  11. N. P. Huxford, D. J. Eaglesham, C. J. Humphreys, Nature329, 812 (1987). (10.1038/329812a0) / Nature (1987)
  12. G. Van Tendeloo, T. Krekels, in Characterization of High TC Materials & Devices by Electron Microscopy, N. D. Browning, S. J. Pennycook, Eds. (Cambridge Univ. Press, Cambridge, 2000), pp. 161–191. / Characterization of High TC Materials & Devices by Electron Microscopy (2000)
  13. 10.1126/science.1089785
  14. A. Recniket al., Philos. Mag. B70, 1021 (1994). (10.1080/01418639408240270) / Philos. Mag. B (1994)
  15. Z. Zhang, W. Siegle, M. Rühle, Phys. Rev. B66, 94108 (2002). (10.1103/PhysRevB.66.094108) / Phys. Rev. B (2002)
  16. 10.1126/science.1079121
  17. C. L. Jia M. Lentzen K. Urban Microsc. Microanal. in press.
  18. C. L. Jiaet al., Philos. Mag. A77, 923 (1998). (10.1080/01418619808221220) / Philos. Mag. A (1998)
  19. T. Suzuki, Y. Nishi, M. J. Fujimoto, J. Am. Ceram. Soc.83, 3185 (2000). (10.1111/j.1151-2916.2000.tb01702.x) / J. Am. Ceram. Soc. (2000)
  20. K. P. Fahey, B. M. Clemens, L. A. Wills, Appl. Phys. Lett.67, 2480 (1995). (10.1063/1.114614) / Appl. Phys. Lett. (1995)
  21. 10.1038/33823
  22. All intensity data are taken from the original unfiltered images.
  23. M. Lentzenet al., Ultramicroscopy92, 233 (2002). (10.1016/S0304-3991(02)00139-0) / Ultramicroscopy (2002)
  24. H. Lichte, Ultramicroscopy38, 13 (1991). (10.1016/0304-3991(91)90105-F) / Ultramicroscopy (1991)
  25. All calculations and numerical image simulations were carried out with the MacTempas software package (M. A. O'Keefe R. Kilaas; National Center for Electron Microscopy Lawrence Berkeley National Laboratory Univ. of California).
  26. J. M. Cowley, A. F. Moodie, Acta Crystallogr.10, 609 (1957). (10.1107/S0365110X57002194) / Acta Crystallogr. (1957)
  27. M. A. O'Keefe, R. Kilaas, Scanning Microsc. Suppl.2, 225 (1988). / Scanning Microsc. Suppl. (1988)
  28. 10.1103/PhysRevLett.82.5052
  29. A. Ourmazd, F. H. Baumann, M. Bode, Y. Kim, Ultramicroscopy34, 237 (1990). (10.1016/0304-3991(90)90018-H) / Ultramicroscopy (1990)
  30. D. Stenkamp, W. Jäger, Ultramicroscopy50, 321 (1993). (10.1016/0304-3991(93)90200-H) / Ultramicroscopy (1993)
  31. C. Kisielowskiet al., Ultramicroscopy58, 131 (1995). (10.1016/0304-3991(94)00202-X) / Ultramicroscopy (1995)
  32. The computer code “Digital Micrograph” (GATAN) is used for this purpose.
  33. M. J. Hÿtch, W. M. Stobbs, Ultramicroscopy53, 63 (1994). (10.1016/0304-3991(94)90105-8) / Ultramicroscopy (1994)
  34. A. Thust, K. Urban, Ultramicroscopy45, 23 (1992). (10.1016/0304-3991(92)90035-I) / Ultramicroscopy (1992)
  35. W. E. King, G. H. Campbell, Ultramicroscopy56, 46 (1994). (10.1016/0304-3991(94)90145-7) / Ultramicroscopy (1994)
  36. R. D. Burbank, H. T. Evans, Acta Crystallogr.1, 330 (1948). (10.1107/S0365110X48000867) / Acta Crystallogr. (1948)
  37. I. E. Greyet al., J. Solid State Chem.135, 312 (1998). (10.1006/jssc.1997.7652) / J. Solid State Chem. (1998)
  38. R. Astala, P. D. Bristowe, J. Phys. Condens. Matter14, 6455 (2002). (10.1088/0953-8984/14/25/313) / J. Phys. Condens. Matter (2002)
  39. We thank A. Thust M. Lentzen K. Tillmann and L. Houben for fruitful discussions and comments on the manuscript.
Dates
Type When
Created 21 years, 5 months ago (March 25, 2004, 4:33 p.m.)
Deposited 1 year, 7 months ago (Jan. 9, 2024, 11:04 p.m.)
Indexed 1 week ago (Aug. 26, 2025, 2:55 a.m.)
Issued 21 years, 5 months ago (March 26, 2004)
Published 21 years, 5 months ago (March 26, 2004)
Published Print 21 years, 5 months ago (March 26, 2004)
Funders 0

None

@article{Jia_2004, title={Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials}, volume={303}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.1093617}, DOI={10.1126/science.1093617}, number={5666}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Jia, C. L. and Urban, K.}, year={2004}, month=mar, pages={2001–2004} }