Abstract
Using high-resolution imaging at negative spherical aberration of the objective lens in an aberration-corrected transmission electron microscope, we measure the concentration of oxygen in Σ3{111} twin boundaries in BaTiO 3 thin films at atomic resolution. On average, 68% of the boundary oxygen sites are occupied, and the others are left vacant. The modified Ti 2 O 9 group unit thus formed reduces the grain boundary energy and provides a way of accommodating oxygen vacancies occurring in oxygen-deficient material by the formation of a nanotwin lamellae structure. The atomically resolved measurement technique offers the potential for studies on oxide materials in which the electronic properties sensitively depend on the local oxygen content.
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Dates
Type | When |
---|---|
Created | 21 years, 5 months ago (March 25, 2004, 4:33 p.m.) |
Deposited | 1 year, 7 months ago (Jan. 9, 2024, 11:04 p.m.) |
Indexed | 1 week ago (Aug. 26, 2025, 2:55 a.m.) |
Issued | 21 years, 5 months ago (March 26, 2004) |
Published | 21 years, 5 months ago (March 26, 2004) |
Published Print | 21 years, 5 months ago (March 26, 2004) |
@article{Jia_2004, title={Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials}, volume={303}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.1093617}, DOI={10.1126/science.1093617}, number={5666}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Jia, C. L. and Urban, K.}, year={2004}, month=mar, pages={2001–2004} }