DOI: 10.1126/science.1092905. Ultrahigh Strength and High Electrical Conductivity in Copper

Ultrahigh Strength and High Electrical Conductivity in Copper

10.1126/science.1092905

Crossref journal-article

American Association for the Advancement of Science (AAAS)

Science (221)

Abstract

Methods used to strengthen metals generally also cause a pronounced decrease in electrical conductivity, so that a tradeoff must be made between conductivity and mechanical strength. We synthesized pure copper samples with a high density of nanoscale growth twins. They showed a tensile strength about 10 times higher than that of conventional coarse-grained copper, while retaining an electrical conductivity comparable to that of pure copper. The ultrahigh strength originates from the effective blockage of dislocation motion by numerous coherent twin boundaries that possess an extremely low electrical resistivity, which is not the case for other types of grain boundaries.

Bibliography

Lu, L., Shen, Y., Chen, X., Qian, L., & Lu, K. (2004). Ultrahigh Strength and High Electrical Conductivity in Copper. Science, 304(5669), 422â426.

Authors 5

Lei Lu (first)
Yongfeng Shen (additional)
Xianhua Chen (additional)
Lihua Qian (additional)
K. Lu (additional)

References 21 Referenced 2,944

D. W. Callister Jr. Materials Science and Engineering An Introduction (Wiley New York ed. 5 2000). (10.1108/acmm.2000.12847aae.001)
E. A. Brandes G. B. Brook Smithells Metals Reference Book (Butterworth-Heinemann Oxford 1998).
10.1080/14786436908225855
10.1016/0001-6160(54)90174-1
10.1016/0079-6425(94)00007-7
10.1016/0040-6090(77)90136-5
A. P. Sutton R. W. Balluffi Interfaces in Crystalline Materials (Clarendon Oxford 1995).
10.1557/JMR.1998.0169
Materials and methods are available as supporting material on Science Online.
10.1016/S0013-4686(01)00583-7
10.1016/S1359-6454(97)00092-X
10.1038/nature01133
10.1063/1.1722294
C. C. Koch, D. G. Morris, K. Lu, A. Inoue, Mater. Res. Soc. Bull.24, 54 (1999). / Mater. Res. Soc. Bull. (1999)
The IACS is material in which the resistance of a wire 1 m in length and weighing 1 g is 0.15328 ohm at 20°C. The electrical conductivity of the coarse-grained OFHC copper at 20°C is 101.5% IACS.
10.1088/0305-4608/5/9/009
10.1002/pssb.19660180215
10.4028/www.scientific.net/MSF.207-209.47
10.1016/S1359-6462(01)00712-6
M. A. Meyers K. K. Chawla Mechanical Behavior of Materials (Prentice Hall Upper Saddle River NJ 1999).
The authors thank the National Natural Science Foundation (grants 50021101 and 50201017) the Ministry of Science and Technology of China (grant G1999064505) and the Max-Planck Society of Germany for financial support; X. Si and H. B. Ma for sample preparation; Z. H. Jin and B. Wu for discussions and TEM experiments; and X. N. Jing for electrical resistivity measurements.

Dates

Type	When
Created	21 years, 5 months ago (March 22, 2004, 8:23 p.m.)
Deposited	1 year, 7 months ago (Jan. 9, 2024, 10:40 p.m.)
Indexed	2 minutes ago (Aug. 28, 2025, 4:49 a.m.)
Issued	21 years, 4 months ago (April 16, 2004)
Published	21 years, 4 months ago (April 16, 2004)
Published Print	21 years, 4 months ago (April 16, 2004)

Funders 0

None

BibTeX

@article{Lu_2004, title={Ultrahigh Strength and High Electrical Conductivity in Copper}, volume={304}, ISSN={1095-9203}, url={http://dx.doi.org/10.1126/science.1092905}, DOI={10.1126/science.1092905}, number={5669}, journal={Science}, publisher={American Association for the Advancement of Science (AAAS)}, author={Lu, Lei and Shen, Yongfeng and Chen, Xianhua and Qian, Lihua and Lu, K.}, year={2004}, month=apr, pages={422–426} }

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