10.1117/12.936590
Crossref proceedings-article
SPIE
SPIE Proceedings (189)
Bibliography

Rehr, J. J. (1986). Refinements in XAFS Theory. X-Rays in Materials Analysis: Novel Applications and Recent Developments, 0690, 2.

Authors 1
  1. J. J. Rehr (first)
References 0 Referenced 2

None

Dates
Type When
Created 12 years, 11 months ago (Oct. 2, 2012, 5 p.m.)
Deposited 7 years, 11 months ago (Sept. 8, 2017, 9:31 p.m.)
Indexed 1 year ago (Sept. 5, 2024, 8:31 a.m.)
Issued 39 years ago (Aug. 12, 1986)
Published 39 years ago (Aug. 12, 1986)
Published Print 39 years ago (Aug. 12, 1986)
Funders 0

None

@inproceedings{Rehr_1986, title={Refinements in XAFS Theory}, volume={0690}, ISSN={0277-786X}, url={http://dx.doi.org/10.1117/12.936590}, DOI={10.1117/12.936590}, booktitle={X-Rays in Materials Analysis: Novel Applications and Recent Developments}, publisher={SPIE}, author={Rehr, J. J.}, editor={Rusch, Thomas W.}, year={1986}, month=aug, pages={2} }