DOI: 10.1117/12.403587. Measurement of rutile TiO 2 dielectric tensor from 0.148 to 33 μm using generalized ellipsometry

Measurement of rutile TiO 2 dielectric tensor from 0.148 to 33 μm using generalized ellipsometry

10.1117/12.403587

Crossref proceedings-article

SPIE

SPIE Proceedings (189)

Bibliography

Tiwald, T. E., & Schubert, M. (2000). Measurement of rutile TiO 2 dielectric tensor from 0.148 to 33 Î¼m using generalized ellipsometry. Optical Diagnostic Methods for Inorganic Materials II, 4103, 19.

Authors 2

Thomas E. Tiwald (first)
Mathias Schubert (additional)

References 0 Referenced 49

None

Dates

Type	When
Created	21 years, 9 months ago (Nov. 19, 2003, 11:11 p.m.)
Deposited	9 years ago (Aug. 9, 2016, 2:32 a.m.)
Indexed	2 months, 3 weeks ago (May 28, 2025, 3:26 a.m.)
Issued	24 years, 10 months ago (Oct. 11, 2000)
Published	24 years, 10 months ago (Oct. 11, 2000)
Published Print	24 years, 10 months ago (Oct. 11, 2000)

Funders 0

None

BibTeX

@inproceedings{Tiwald_2000, title={Measurement of rutile TiO 2 dielectric tensor from 0.148 to 33 μm using generalized ellipsometry}, volume={4103}, ISSN={0277-786X}, url={http://dx.doi.org/10.1117/12.403587}, DOI={10.1117/12.403587}, booktitle={Optical Diagnostic Methods for Inorganic Materials II}, publisher={SPIE}, author={Tiwald, Thomas E. and Schubert, Mathias}, editor={Hanssen, Leonard M.}, year={2000}, month=oct, pages={19} }

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