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proceedings-article
SPIE
SPIE Proceedings (189)
Dates
Type | When |
---|---|
Created | 20 years, 8 months ago (Dec. 30, 2004, 1:05 p.m.) |
Deposited | 8 years, 6 months ago (March 6, 2017, 4:16 p.m.) |
Indexed | 1 year ago (Sept. 6, 2024, 10:13 p.m.) |
Issued | 30 years, 3 months ago (May 19, 1995) |
Published | 30 years, 3 months ago (May 19, 1995) |
Published Print | 30 years, 3 months ago (May 19, 1995) |
@inproceedings{Thompson_1995, title={Toward a commercial gas field ion source}, volume={2437}, ISSN={0277-786X}, url={http://dx.doi.org/10.1117/12.209185}, DOI={10.1117/12.209185}, booktitle={Electron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing V}, publisher={SPIE}, author={Thompson, William B. and Armstrong, A. and Etchin, S. and Hill, Raymond and Kalbitzer, Sigfried and Percival, R. and Saxonis, A. and Wilbertz, Christoph}, editor={Warlaumont, John M.}, year={1995}, month=may, pages={284} }