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proceedings-article
SPIE
SPIE Proceedings (189)
Dates
Type | When |
---|---|
Created | 20 years, 7 months ago (Dec. 30, 2004, 1:05 p.m.) |
Deposited | 8 years, 5 months ago (March 6, 2017, 4:17 p.m.) |
Indexed | 3 months, 2 weeks ago (May 8, 2025, 3:23 a.m.) |
Issued | 30 years, 3 months ago (May 19, 1995) |
Published | 30 years, 3 months ago (May 19, 1995) |
Published Print | 30 years, 3 months ago (May 19, 1995) |
@inproceedings{Moore_1995, title={Lithography and the future of Moore’s law}, volume={2437}, ISSN={0277-786X}, url={http://dx.doi.org/10.1117/12.209151}, DOI={10.1117/12.209151}, booktitle={Electron-Beam, X-Ray, EUV, and Ion-Beam Submicrometer Lithographies for Manufacturing V}, publisher={SPIE}, author={Moore, Gordon E.}, editor={Warlaumont, John M.}, year={1995}, month=may, pages={2} }