DOI: 10.1117/12.139346. <title>Investigation into bake-reversible low-level ESD-induced leakage</title>

<title>Investigation into bake-reversible low-level ESD-induced leakage</title>

10.1117/12.139346

Crossref proceedings-article

SPIE

SPIE Proceedings (189)

Bibliography

Dickson, N., Miller, J. W., Jackson, M., Kohn, S., Pyle, R. E., & Tatti, S. (1993). <title>Investigation into bake-reversible low-level ESD-induced leakage</title> Microelectronics Manufacturing and Reliability, 1802, 155â166.

Authors 6

Nicholas Dickson (first)
James W. Miller (additional)
Mark Jackson (additional)
Stella Kohn (additional)
Ronald E. Pyle (additional)
Sudhindra Tatti (additional)

References 0 Referenced 3

None

Dates

Type	When
Created	20 years, 7 months ago (Jan. 19, 2005, 6:25 p.m.)
Deposited	12 years, 5 months ago (March 13, 2013, 6:25 p.m.)
Indexed	11 months, 2 weeks ago (Sept. 4, 2024, 8:10 a.m.)
Issued	32 years, 7 months ago (Jan. 14, 1993)
Published	32 years, 7 months ago (Jan. 14, 1993)
Published Print	32 years, 7 months ago (Jan. 14, 1993)

Funders 0

None

BibTeX

@inproceedings{Dickson_1993, title={<title>Investigation into bake-reversible low-level ESD-induced leakage</title>}, volume={1802}, ISSN={0277-786X}, url={http://dx.doi.org/10.1117/12.139346}, DOI={10.1117/12.139346}, booktitle={Microelectronics Manufacturing and Reliability}, publisher={SPIE}, author={Dickson, Nicholas and Miller, James W. and Jackson, Mark and Kohn, Stella and Pyle, Ronald E. and Tatti, Sudhindra}, editor={Vasquez, Barbara and Sabnis, Anant G. and MacWilliams, Kenneth P. and Woo, Jason C.}, year={1993}, month=jan, pages={155–166} }

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