DOI: 10.1117/12.139342. <title>Investigation of particle-induced timing sensitivity in one-megabit DRAMs</title>

<title>Investigation of particle-induced timing sensitivity in one-megabit DRAMs</title>

10.1117/12.139342

Crossref proceedings-article

SPIE

SPIE Proceedings (189)

Bibliography

Black, E., Bridwell, J., & McConnell, R. (1993). <title>Investigation of particle-induced timing sensitivity in one-megabit DRAMs</title> Microelectronics Manufacturing and Reliability, 1802, 120â125.

Authors 3

Ed Black (first)
John Bridwell (additional)
R. McConnell (additional)

References 0 Referenced 4

None

Dates

Type	When
Created	20 years, 7 months ago (Jan. 19, 2005, 6:25 p.m.)
Deposited	12 years, 5 months ago (March 13, 2013, 6:41 p.m.)
Indexed	11 months, 2 weeks ago (Sept. 7, 2024, 12:50 a.m.)
Issued	32 years, 7 months ago (Jan. 14, 1993)
Published	32 years, 7 months ago (Jan. 14, 1993)
Published Print	32 years, 7 months ago (Jan. 14, 1993)

Funders 0

None

BibTeX

@inproceedings{Black_1993, title={<title>Investigation of particle-induced timing sensitivity in one-megabit DRAMs</title>}, volume={1802}, ISSN={0277-786X}, url={http://dx.doi.org/10.1117/12.139342}, DOI={10.1117/12.139342}, booktitle={Microelectronics Manufacturing and Reliability}, publisher={SPIE}, author={Black, Ed and Bridwell, John and McConnell, R.}, editor={Vasquez, Barbara and Sabnis, Anant G. and MacWilliams, Kenneth P. and Woo, Jason C.}, year={1993}, month=jan, pages={120–125} }

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