DOI: 10.1116/1.587716. Si donors (SiGa) in GaAs observed by scanning tunneling microscopy

Si donors (SiGa) in GaAs observed by scanning tunneling microscopy

10.1116/1.587716

Crossref journal-article

American Vacuum Society

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena (20)

Abstract

We report the direct observation of SiGa donors in the top six layers of GaAs(110). Surface SiGa has a localized electronic feature due to its dangling bond, while subsurface SiGa produces delocalized protrusions in filled and empty state scanning tunneling microscopy images, with a full width at half-maximum of ∼25 Å and a height from ∼0.2 to 2 Å, depending on the sample bias and location under the surface. The delocalized features of subsurface SiGa can be understood in terms of the perturbation of the local band structure by the Coulomb potential of SiGa.

Bibliography

Zheng, J. F., Liu, X., Weber, E. R., Ogletree, D. F., & Salmeron, M. (1994). Si donors (SiGa) in GaAs observed by scanning tunneling microscopy. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 12(3), 2104â2106.

Authors 5

J. F. Zheng (first)
X. Liu (additional)
E. R. Weber (additional)
D. F. Ogletree (additional)
M. Salmeron (additional)

References 0 Referenced 12

None

Dates

Type	When
Created	23 years, 1 month ago (July 27, 2002, 5:12 a.m.)
Deposited	2 years ago (Aug. 2, 2023, 7:27 p.m.)
Indexed	1 month, 2 weeks ago (July 12, 2025, 6:50 p.m.)
Issued	31 years, 3 months ago (May 1, 1994)
Published	31 years, 3 months ago (May 1, 1994)
Published Print	31 years, 3 months ago (May 1, 1994)

Funders 0

None

BibTeX

@article{Zheng_1994, title={Si donors (SiGa) in GaAs observed by scanning tunneling microscopy}, volume={12}, ISSN={1520-8567}, url={http://dx.doi.org/10.1116/1.587716}, DOI={10.1116/1.587716}, number={3}, journal={Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena}, publisher={American Vacuum Society}, author={Zheng, J. F. and Liu, X. and Weber, E. R. and Ogletree, D. F. and Salmeron, M.}, year={1994}, month=may, pages={2104–2106} }

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