DOI: 10.1116/1.585563. Scanning chemical potential microscope: A new technique for atomic scale surface investigation

Scanning chemical potential microscope: A new technique for atomic scale surface investigation

10.1116/1.585563

Crossref journal-article

American Vacuum Society

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena (20)

Abstract

A new microscope, the scanning chemical potential microscope (SCPM), has demonstrated the measurement of thermoelectric potential variations with atomic resolution. These measurements can be attributed to atomic scale variations in the surface chemical potential gradient (∂μ/∂T). This capability was experimentally demonstrated by measuring the thermoelectric voltage produced at the tunnel junction between a tip and a heated sample with a modified scanning tunnelling microscope (STM). Registered images of STM current and thermoelectric voltage were acquired by temporally multiplexing current and voltage data from line to line, providing a direct spatial comparison of current and voltage contrast. The results on graphite and molybdenum disulfide demonstrate that the tunnelling and thermoelectric contrast is spatially different on an atomic scale. The experiments are described, and the results of some first order classical calculations are presented.

Bibliography

Williams, C. C., & Wickramasinghe, H. K. (1991). Scanning chemical potential microscope: A new technique for atomic scale surface investigation. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 9(2), 537â540.

Authors 2

C. C. Williams (first)
H. K. Wickramasinghe (additional)

References 0 Referenced 17

None

Dates

Type	When
Created	23 years ago (July 27, 2002, 5:24 a.m.)
Deposited	2 years ago (Aug. 7, 2023, 12:21 a.m.)
Indexed	1 year, 2 months ago (June 12, 2024, 8:37 a.m.)
Issued	34 years, 5 months ago (March 1, 1991)
Published	34 years, 5 months ago (March 1, 1991)
Published Print	34 years, 5 months ago (March 1, 1991)

Funders 0

None

BibTeX

@article{Williams_1991, title={Scanning chemical potential microscope: A new technique for atomic scale surface investigation}, volume={9}, ISSN={1520-8567}, url={http://dx.doi.org/10.1116/1.585563}, DOI={10.1116/1.585563}, number={2}, journal={Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena}, publisher={American Vacuum Society}, author={Williams, C. C. and Wickramasinghe, H. K.}, year={1991}, month=mar, pages={537–540} }

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