Abstract
This paper highlights the basic principles of rapid thermal processing (RTP) systems and the important areas of concern. The basic system characteristics, the fundamental physics involved, and the techniques for temperature measurement and control are extensively reviewed. We summarize the options currently available for 15 RTP equipment manufacturers and point out the latest developments in RTP system design and temperature measurement. Some novel options for temperature control (optical, fiber optical, and photoacoustic) are included.
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 27, 2002, 5:24 a.m.) |
Deposited | 2 years, 1 month ago (July 6, 2023, 10:31 p.m.) |
Indexed | 1 month ago (July 30, 2025, 10:47 a.m.) |
Issued | 34 years, 10 months ago (Nov. 1, 1990) |
Published | 34 years, 10 months ago (Nov. 1, 1990) |
Published Print | 34 years, 10 months ago (Nov. 1, 1990) |
@article{Roozeboom_1990, title={Rapid thermal processing systems: A review with emphasis on temperature control}, volume={8}, ISSN={2327-9877}, url={http://dx.doi.org/10.1116/1.584902}, DOI={10.1116/1.584902}, number={6}, journal={Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena}, publisher={American Vacuum Society}, author={Roozeboom, Fred and Parekh, N.}, year={1990}, month=nov, pages={1249–1259} }