DOI: 10.1116/1.576399. Localized charge force microscopy

10.1116/1.576399

Crossref journal-article

American Vacuum Society

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (20)

Abstract

A force microscope has been used to deposit and image localized charge on insulating surfaces. The charge is deposited either by applying a voltage pulse to the microscope tip or by contact charging the insulator surface with the tip. An improved mode of charge imaging is presented, which distinguishes between charge and topography and allows the sign of the charge to be determined in a single scan.

Bibliography

Terris, B. D., Stern, J. E., Rugar, D., & Mamin, H. J. (1990). Localized charge force microscopy. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 8(1), 374â377.

Authors 4

B. D. Terris (first)
J. E. Stern (additional)
D. Rugar (additional)
H. J. Mamin (additional)

References 0 Referenced 75

None

Dates

Type	When
Created	23 years, 1 month ago (July 27, 2002, 5:20 a.m.)
Deposited	2 years, 1 month ago (July 26, 2023, 11:11 p.m.)
Indexed	1 month, 4 weeks ago (July 7, 2025, 3:06 a.m.)
Issued	35 years, 8 months ago (Jan. 1, 1990)
Published	35 years, 8 months ago (Jan. 1, 1990)
Published Print	35 years, 8 months ago (Jan. 1, 1990)

Funders 0

None

BibTeX

@article{Terris_1990, title={Localized charge force microscopy}, volume={8}, ISSN={1520-8559}, url={http://dx.doi.org/10.1116/1.576399}, DOI={10.1116/1.576399}, number={1}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Terris, B. D. and Stern, J. E. and Rugar, D. and Mamin, H. J.}, year={1990}, month=jan, pages={374–377} }

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