Crossref journal-article
American Vacuum Society
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (20)
Abstract

Structural analysis of the surface reconstructions investigated by ultrahigh vacuum (UHV) transmission electron microscopy (TEM) and diffraction (TED) is shown. By TED intensity analysis a new structural model of Si(111)-7×7 is derived. The model basically consists of 12 adatoms arranged locally in the 2×2 structure, nine dimers on the sides of the triangular subunits of the 7×7 unit cell and a stacking fault layer. UHV–HREM of Si (111)-7×7 surface is commented.

Bibliography

Takayanagi, K., Tanishiro, Y., Takahashi, M., & Takahashi, S. (1985). Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 3(3), 1502–1506.

Authors 4
  1. K. Takayanagi (first)
  2. Y. Tanishiro (additional)
  3. M. Takahashi (additional)
  4. S. Takahashi (additional)
References 0 Referenced 1,241

None

Dates
Type When
Created 23 years, 1 month ago (July 27, 2002, 5:28 a.m.)
Deposited 2 years, 2 months ago (June 26, 2023, 3:22 p.m.)
Indexed 2 days, 13 hours ago (Sept. 3, 2025, 6:26 a.m.)
Issued 40 years, 4 months ago (May 1, 1985)
Published 40 years, 4 months ago (May 1, 1985)
Published Print 40 years, 4 months ago (May 1, 1985)
Funders 0

None

@article{Takayanagi_1985, title={Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy}, volume={3}, ISSN={1520-8559}, url={http://dx.doi.org/10.1116/1.573160}, DOI={10.1116/1.573160}, number={3}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Takayanagi, K. and Tanishiro, Y. and Takahashi, M. and Takahashi, S.}, year={1985}, month=may, pages={1502–1506} }