Abstract
Structural analysis of the surface reconstructions investigated by ultrahigh vacuum (UHV) transmission electron microscopy (TEM) and diffraction (TED) is shown. By TED intensity analysis a new structural model of Si(111)-7×7 is derived. The model basically consists of 12 adatoms arranged locally in the 2×2 structure, nine dimers on the sides of the triangular subunits of the 7×7 unit cell and a stacking fault layer. UHV–HREM of Si (111)-7×7 surface is commented.
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 27, 2002, 5:28 a.m.) |
Deposited | 2 years, 2 months ago (June 26, 2023, 3:22 p.m.) |
Indexed | 2 days, 13 hours ago (Sept. 3, 2025, 6:26 a.m.) |
Issued | 40 years, 4 months ago (May 1, 1985) |
Published | 40 years, 4 months ago (May 1, 1985) |
Published Print | 40 years, 4 months ago (May 1, 1985) |
@article{Takayanagi_1985, title={Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy}, volume={3}, ISSN={1520-8559}, url={http://dx.doi.org/10.1116/1.573160}, DOI={10.1116/1.573160}, number={3}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Takayanagi, K. and Tanishiro, Y. and Takahashi, M. and Takahashi, S.}, year={1985}, month=may, pages={1502–1506} }