Crossref journal-article
American Vacuum Society
Journal of Vacuum Science and Technology (20)
Abstract

The relaxed (110) surface electronic structure of GaAs is calculated within the tight-binding model. The symmetry and dispersion of the surface states are compared to those measured by angle-resolved photoemission experiments. Variations in photoemission intensity with measurement geometry are related to matrix-element modulation effects and it is shown that angle-resolved measurements can give information on the symmetry of surface states.

Bibliography

Chadi, D. J. (1978). (110) surface states of GaAs and matrix element effects in angle-resolved photoemission. Journal of Vacuum Science and Technology, 15(4), 1244–1248.

Authors 1
  1. D. J. Chadi (first)
References 0 Referenced 42

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Dates
Type When
Created 23 years, 1 month ago (July 27, 2002, 5:31 a.m.)
Deposited 2 years, 1 month ago (July 25, 2023, 2:37 a.m.)
Indexed 2 years ago (Aug. 26, 2023, 6:19 a.m.)
Issued 47 years, 1 month ago (July 1, 1978)
Published 47 years, 1 month ago (July 1, 1978)
Published Print 47 years, 1 month ago (July 1, 1978)
Funders 0

None

@article{Chadi_1978, title={(110) surface states of GaAs and matrix element effects in angle-resolved photoemission}, volume={15}, ISSN={0022-5355}, url={http://dx.doi.org/10.1116/1.569746}, DOI={10.1116/1.569746}, number={4}, journal={Journal of Vacuum Science and Technology}, publisher={American Vacuum Society}, author={Chadi, D. J.}, year={1978}, month=jul, pages={1244–1248} }