Abstract
Characteristic x-ray emission from a well grounded stainless steel specimen using standard 30keV Ga+ focused ion beam instrumentation is demonstrated. X-ray yields are found to be on the order of 10−10 per incident ion, consistent with previous studies of low energy, high mass ion-solid interactions. X-ray yields were found to be highest for low energy transitions or low atomic number target atoms. Bremsstrahlung x-ray emission was found to be minimal, possibly increasing detectability compared with electron beam induced x-rays. Yields were also estimated to be on the order of 10−11 per sputtered atom, or approximately one x-ray per sputtered monolayer. While velocity coupling between the primary ion beam and target atom electrons is not possible under these experimental conditions, it is argued that x-ray emission is, in fact, due to recoil effects of the ion-solid interaction.
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Dates
Type | When |
---|---|
Created | 16 years, 1 month ago (June 30, 2009, 7:19 p.m.) |
Deposited | 2 years ago (July 30, 2023, 9:59 p.m.) |
Indexed | 1 year, 6 months ago (Jan. 26, 2024, 9:41 a.m.) |
Issued | 16 years, 2 months ago (June 1, 2009) |
Published | 16 years, 2 months ago (June 1, 2009) |
Published Online | 16 years, 2 months ago (June 1, 2009) |
Published Print | 16 years, 1 month ago (July 1, 2009) |
@article{Giannuzzi_2009, title={Particle-induced x-ray emission in stainless steel using 30keV Ga+ focused ion beams}, volume={27}, ISSN={1520-8559}, url={http://dx.doi.org/10.1116/1.3136852}, DOI={10.1116/1.3136852}, number={4}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Giannuzzi, Lucille A. and Gorman, Brian P.}, year={2009}, month=jun, pages={668–671} }