Crossref journal-article
American Vacuum Society
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena (20)
Abstract

Tin dioxide (SnO2) is widely used as sensing material in metal-oxides gas sensors. In this work we present two lithographic approaches for SnO2 patterning, an additive process and a subtractive one. In the first case patterns of SnO2 nanowires are successfully fabricated and exploited as sensing element in working devices; responses to several testing gases are satisfactorily improved with respect to continuous film devices. Regarding the subtractive process, we present reactive ion etching of SnO2 based on CF4∕H2 gas mixture. Dependence of etch rate upon H2 concentration and effects due to Ar additions to plasma are investigated; results are discussed and a possible etching reaction is proposed, but further developments are required to increase the etch rate.

Bibliography

Candeloro, P., Comini, E., Baratto, C., Faglia, G., Sberveglieri, G., Kumar, R., Carpentiero, A., & Fabrizio, E. D. (2005). Sn O 2 lithographic processing for nanopatterned gas sensors. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 23(6), 2784–2788.

Authors 8
  1. P. Candeloro (first)
  2. E. Comini (additional)
  3. C. Baratto (additional)
  4. G. Faglia (additional)
  5. G. Sberveglieri (additional)
  6. R. Kumar (additional)
  7. A. Carpentiero (additional)
  8. E. Di Fabrizio (additional)
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Dates
Type When
Created 19 years, 7 months ago (Jan. 11, 2006, 6:25 p.m.)
Deposited 2 years, 1 month ago (Aug. 2, 2023, 5:21 a.m.)
Indexed 1 month ago (Aug. 3, 2025, 6:54 p.m.)
Issued 19 years, 10 months ago (Nov. 1, 2005)
Published 19 years, 10 months ago (Nov. 1, 2005)
Published Online 19 years, 9 months ago (Dec. 2, 2005)
Published Print 19 years, 10 months ago (Nov. 1, 2005)
Funders 0

None

@article{Candeloro_2005, title={Sn O 2 lithographic processing for nanopatterned gas sensors}, volume={23}, ISSN={1520-8567}, url={http://dx.doi.org/10.1116/1.2110371}, DOI={10.1116/1.2110371}, number={6}, journal={Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena}, publisher={American Vacuum Society}, author={Candeloro, P. and Comini, E. and Baratto, C. and Faglia, G. and Sberveglieri, G. and Kumar, R. and Carpentiero, A. and Fabrizio, E. Di}, year={2005}, month=nov, pages={2784–2788} }