DOI: 10.1116/1.1872014. Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement

Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement

10.1116/1.1872014

Crossref journal-article

American Vacuum Society

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (20)

Bibliography

Yagi, T., Tamano, K., Sato, Y., Taketoshi, N., Baba, T., & Shigesato, Y. (2005). Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 23(4), 1180â1186.

Authors 6

Takashi Yagi (first)
Kimiaki Tamano (additional)
Yasushi Sato (additional)
Naoyuki Taketoshi (additional)
Tetsuya Baba (additional)
Yuzo Shigesato (additional)

References 23 Referenced 74

10.1063/1.337642
10.1103/PhysRevLett.59.1962
10.1103/PhysRevB.37.1085
10.1068/htec301
N. Taketoshi, T. Baba, and A. Ono, Thermal Conductivity 24 Thermal Expansion 12 (Technomic, Lancaster, PA, 1998), p. 248.
10.1068/htwu125
10.1143/JJAP.38.L1268
10.1088/0957-0233/12/12/306
10.1063/1.357560
{'key': 'c10', 'volume-title': 'Proceedings of the 14th Symposium on Thermophysical Properties', 'author': 'Feldmann A.', 'year': '2000'} / Proceedings of the 14th Symposium on Thermophysical Properties by Feldmann A. (2000)
10.1103/PhysRevB.35.4067
10.1063/1.1141498
{'key': 'c13', 'volume-title': 'Proceedings of the 1st International Symposium on Standard Materials and Metrology for Nanotechnology', 'author': 'Ichihara K.', 'year': '2004'} / Proceedings of the 1st International Symposium on Standard Materials and Metrology for Nanotechnology by Ichihara K. (2004)
10.1063/1.1628840
10.1016/0040-6090(94)90646-7
10.1063/1.350931
10.1116/1.576890
10.1063/1.91829
10.1063/1.1728417
T. Baba and N. Taketoshi, Proceedings of the 21st Japan Symposium Thermophysical Properites (Japan Society of Thermophysical Properties, Nagoya, 2000), p. 229.
{'key': 'c22', 'volume-title': 'Proceedings of the 10th International Workshop on THERMAL INVESTIGATIONS of ICs and Systems (Therminic 2004)', 'author': 'Baba T.', 'year': '2004'} / Proceedings of the 10th International Workshop on THERMAL INVESTIGATIONS of ICs and Systems (Therminic 2004) by Baba T. (2004)
Y. S. Touloukian, R. W. Powell, C. Y. Ho, and M. C. Nicolaou, Thermophysical Properties of Matter (IFI/Plenum, New York, 1973), p. 10.
10.1002/9783527619825

Dates

Type	When
Created	19 years, 11 months ago (Sept. 12, 2005, 4:48 p.m.)
Deposited	2 years, 4 months ago (April 20, 2023, 7:14 p.m.)
Indexed	2 months ago (June 28, 2025, 12:23 a.m.)
Issued	20 years, 1 month ago (July 1, 2005)
Published	20 years, 1 month ago (July 1, 2005)
Published Print	20 years, 1 month ago (July 1, 2005)

Funders 0

None

BibTeX

@article{Yagi_2005, title={Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement}, volume={23}, ISSN={1520-8559}, url={http://dx.doi.org/10.1116/1.1872014}, DOI={10.1116/1.1872014}, number={4}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Yagi, Takashi and Tamano, Kimiaki and Sato, Yasushi and Taketoshi, Naoyuki and Baba, Tetsuya and Shigesato, Yuzo}, year={2005}, month=jul, pages={1180–1186} }

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