Crossref journal-article
American Vacuum Society
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena (20)
Abstract

Zone-plate-array lithography (ZPAL) uses an array of zone plates, combined with an array of micromechanical mirrors or shutters, to pattern features on a substrate without a mask. In this article, we investigate the patterning characteristics of individual zone plates. We show patterns printed with pixel-dose modulation (gray scaling) and subpixel beam stepping. Using a combination of these techniques for linewidth control, edge placement, and proximity-effect correction, ZPAL can produce arbitrary patterns with features as small as the focal spot of a zone plate. We also demonstrate the use of zone plates in a confocal-microscopy mode for placing the substrate at the focus of the zone plates, and for imaging. Zone-plate-array scanning-confocal microscopy (ZPAM) could be useful for gapping and alignment in ZPAL, and possibly for wafer or mask inspection at deep ultraviolet wavelengths.

Bibliography

Gil, D., Menon, R., Carter, D. J. D., & Smith, H. I. (2000). Lithographic patterning and confocal imaging with zone plates. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 18(6), 2881–2885.

Authors 4
  1. Darı́o Gil (first)
  2. Rajesh Menon (additional)
  3. D. J. D. Carter (additional)
  4. Henry I. Smith (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 27, 2002, 5:18 a.m.)
Deposited 2 years ago (Aug. 9, 2023, 2:13 a.m.)
Indexed 2 years ago (Aug. 9, 2023, 2:53 a.m.)
Issued 24 years, 9 months ago (Nov. 1, 2000)
Published 24 years, 9 months ago (Nov. 1, 2000)
Published Print 24 years, 9 months ago (Nov. 1, 2000)
Funders 0

None

@article{Gil_2000, title={Lithographic patterning and confocal imaging with zone plates}, volume={18}, ISSN={1520-8567}, url={http://dx.doi.org/10.1116/1.1321293}, DOI={10.1116/1.1321293}, number={6}, journal={Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena}, publisher={American Vacuum Society}, author={Gil, Darı́o and Menon, Rajesh and Carter, D. J. D. and Smith, Henry I.}, year={2000}, month=nov, pages={2881–2885} }