DOI: 10.1111/jmi.12071. Integration of a high‐NA light microscope in a scanning electron microscope

Integration of a high‐NA light microscope in a scanning electron microscope

10.1111/jmi.12071

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SummaryWe present an integrated light‐electron microscope in which an inverted high‐NA objective lens is positioned inside a scanning electron microscope (SEM). The SEM objective lens and the light objective lens have a common axis and focal plane, allowing high‐resolution optical microscopy and scanning electron microscopy on the same area of a sample simultaneously. Components for light illumination and detection can be mounted outside the vacuum, enabling flexibility in the construction of the light microscope. The light objective lens can be positioned underneath the SEM objective lens during operation for sub‐10 μm alignment of the fields of view of the light and electron microscopes. We demonstrate in situ epifluorescence microscopy in the SEM with a numerical aperture of 1.4 using vacuum‐compatible immersion oil. For a 40‐nm‐diameter fluorescent polymer nanoparticle, an intensity profile with a FWHM of 380 nm is measured whereas the SEM performance is uncompromised. The integrated instrument may offer new possibilities for correlative light and electron microscopy in the life sciences as well as in physics and chemistry.

Bibliography

ZONNEVYLLE, A. C., VAN TOL, R. F. C., LIV, N., NARVAEZ, A. C., EFFTING, A. P. J., KRUIT, P., & HOOGENBOOM, J. P. (2013). Integration of a highâNA light microscope in a scanning electron microscope. Journal of Microscopy, 252(1), 58â70. Portico.

Authors 7

A.C. ZONNEVYLLE (first)
R.F.C. VAN TOL (additional)
N. LIV (additional)
A.C. NARVAEZ (additional)
A.P.J. EFFTING (additional)
P. KRUIT (additional)
J.P. HOOGENBOOM (additional)

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Dates

Type	When
Created	12 years, 1 month ago (July 25, 2013, 5:05 p.m.)
Deposited	1 year, 10 months ago (Oct. 1, 2023, 6:13 a.m.)
Indexed	4 months, 3 weeks ago (April 3, 2025, 8:31 p.m.)
Issued	12 years, 1 month ago (July 25, 2013)
Published	12 years, 1 month ago (July 25, 2013)
Published Online	12 years, 1 month ago (July 25, 2013)
Published Print	11 years, 10 months ago (Oct. 1, 2013)

Funders 2

STW Valorization
NanoNextNL, a nanotechnology consortium of the Government of the Netherlands and 130 partners

BibTeX

@article{ZONNEVYLLE_2013, title={Integration of a high‐NA light microscope in a scanning electron microscope}, volume={252}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/jmi.12071}, DOI={10.1111/jmi.12071}, number={1}, journal={Journal of Microscopy}, publisher={Wiley}, author={ZONNEVYLLE, A.C. and VAN TOL, R.F.C. and LIV, N. and NARVAEZ, A.C. and EFFTING, A.P.J. and KRUIT, P. and HOOGENBOOM, J.P.}, year={2013}, month=jul, pages={58–70} }

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