Crossref
journal-article
Wiley
Annals of the New York Academy of Sciences (311)
References
7
Referenced
31
10.1063/1.1730126
- Lander J. J.&J.Morrison.1962.Surface structure analysis of silicon by low energy electron diffraction.J. Chem. Phys. To be published.
10.1103/PhysRev.60.447
10.1007/BF02724786
10.1063/1.1777087
10.1063/1.1717051
10.1111/j.1749-6632.1963.tb54917.x
Dates
Type | When |
---|---|
Created | 15 years, 1 month ago (July 19, 2010, 11:33 a.m.) |
Deposited | 1 year, 11 months ago (Sept. 25, 2023, 12:38 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 25, 2024, 2:23 a.m.) |
Issued | 62 years, 8 months ago (Jan. 1, 1963) |
Published | 62 years, 8 months ago (Jan. 1, 1963) |
Published Online | 18 years, 8 months ago (Dec. 22, 2006) |
Published Print | 62 years, 8 months ago (Jan. 1, 1963) |
@article{MacRae_1963, title={THE INTERATOMIC SPACINGS AT THE SURFACE OF A CLEAN NICKEL CRYSTAL}, volume={101}, ISSN={1749-6632}, url={http://dx.doi.org/10.1111/j.1749-6632.1963.tb54919.x}, DOI={10.1111/j.1749-6632.1963.tb54919.x}, number={3}, journal={Annals of the New York Academy of Sciences}, publisher={Wiley}, author={MacRae, A. U. and Germer, Lester H.}, year={1963}, month=jan, pages={627–633} }