DOI: 10.1111/j.1551-2916.2005.00663.x. Aging in Ferroelectrics

10.1111/j.1551-2916.2005.00663.x

Crossref journal-article

Wiley

Journal of the American Ceramic Society (311)

Abstract

The reorientation of defect dipoles and the drift of free charge carriers are the most prominent microscopic mechanisms under discussion to provoke the aging effect in ferroelectrics. These two mechanisms are contrasted taking into account the influence of grain boundaries in a polycrystalline material. For the drift model, clamping pressures on domain walls only depend on geometry and on the transport properties of the mobile defect charge carrier independent of its electronic or ionic nature. For a numerical example clamping pressures as a result of drift of oxygen vacancies are determined in BaTiO3. They range from 106 to 107 Pa corresponding to experimental values.

Bibliography

Lupascu, D. C., Genenko, Y. A., & Balke, N. (2005). Aging in Ferroelectrics. Journal of the American Ceramic Society, 89(1), 224â229. Portico.

Authors 3

Doru C. Lupascu (first)
Yuri A. Genenko (additional)
Nina Balke (additional)

References 48 Referenced 94

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Dates

Type	When
Created	19 years, 10 months ago (Oct. 4, 2005, 4:46 a.m.)
Deposited	1 year, 10 months ago (Oct. 16, 2023, 5:20 a.m.)
Indexed	4 months ago (April 15, 2025, 11:39 a.m.)
Issued	19 years, 10 months ago (Oct. 4, 2005)
Published	19 years, 10 months ago (Oct. 4, 2005)
Published Online	19 years, 10 months ago (Oct. 4, 2005)
Published Print	19 years, 7 months ago (Jan. 1, 2006)

Funders 0

None

BibTeX

@article{Lupascu_2005, title={Aging in Ferroelectrics}, volume={89}, ISSN={1551-2916}, url={http://dx.doi.org/10.1111/j.1551-2916.2005.00663.x}, DOI={10.1111/j.1551-2916.2005.00663.x}, number={1}, journal={Journal of the American Ceramic Society}, publisher={Wiley}, author={Lupascu, Doru C. and Genenko, Yuri A. and Balke, Nina}, year={2005}, month=oct, pages={224–229} }

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