DOI: 10.1111/j.1365-2818.2007.01775.x. A technique for improved focused ion beam milling of cryo‐prepared life science specimens

A technique for improved focused ion beam milling of cryo‐prepared life science specimens

10.1111/j.1365-2818.2007.01775.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SummaryThe combination of focused ion beam and scanning electron microscopy with a cryo‐preparation/transfer system allows specimens to be milled at low temperatures. However, for biological specimens in particular, the quality of results is strongly dependent on correct preparation of the specimen surface. We demonstrate a method for deposition of a protective, planarizing surface layer onto a cryo‐sample, enabling high‐quality cross‐sectioning using the ion beam and investigation of structures at the nanoscale.

Bibliography

HAYLES, M. F., STOKES, D. J., PHIFER, D., & FINDLAY, K. C. (2007). A technique for improved focused ion beam milling of cryoâprepared life science specimens. Journal of Microscopy, 226(3), 263â269. Portico.

Authors 4

M. F. HAYLES (first)
D. J. STOKES (additional)
D. PHIFER (additional)
K. C. FINDLAY (additional)

References 34 Referenced 119

10.3139/147.100256
10.2307/3870995
10.1111/j.1365-2818.2005.01490.x
10.1017/S0033583500004297
10.1007/978-1-4899-2302-8
10.1016/B978-0-12-140407-9.50005-2
10.1016/S0958-6946(99)00149-1
10.1002/jbm.b.30386
10.1016/j.jsb.2006.03.006
10.1116/1.1445165
10.1002/app.11996
10.1111/j.1365-2818.2006.01567.x
10.1002/sca.4950210603
10.1111/j.1095-8339.1985.tb01149.x
10.2138/am.2005.1743
{'key': 'e_1_2_6_17_1', 'volume-title': 'FIB and Its Applications', 'author': 'Orloff J.', 'year': '2003'} / FIB and Its Applications by Orloff J. (2003)
10.1093/jmicro/dfl014
10.1111/j.1365-2818.1991.tb03073.x
10.1111/j.1469-8137.2006.01825.x
10.1104/pp.103.021873
10.1128/EC.3.4.984-991.2004
{'key': 'e_1_2_6_23_1', 'first-page': '835', 'article-title': 'Low‐temperature scanning electron microscopy – advantages and applications', 'volume': '2', 'author': 'Sargent J.', 'year': '1988', 'journal-title': 'Scanning Microsc.'} / Scanning Microsc. / Low‐temperature scanning electron microscopy – advantages and applications by Sargent J. (1988)
10.1111/j.1365-2818.2006.01603.x
10.1007/978-3-642-72815-0_4
10.1111/j.1365-2818.2004.01282.x
{'key': 'e_1_2_6_27_1', 'volume-title': 'EMAG‐Nano 2005: Imaging, Analysis and Fabrication on the Nanoscale', 'author': 'Stokes D.', 'year': '2006'} / EMAG‐Nano 2005: Imaging, Analysis and Fabrication on the Nanoscale by Stokes D. (2006)
10.1046/j.1365-2818.2001.00919.x
10.1111/j.1365-2818.1974.tb03871.x
10.1016/j.jcis.2004.12.008
10.1111/1365-3040.ep11580525 / Plant cell Environ / Scanning electron microscopic aspects of short tuberized roots, with special reference to cell rhizodermis evolution under drought and rehydration by Vartanian N. (1982)
10.1002/sca.4950120604
10.1046/j.1365-2818.1999.00595.x
10.1046/j.1365-2818.2003.01236.x
10.1046/j.1365-313X.1997.12040757.x

Dates

Type	When
Created	18 years, 2 months ago (May 24, 2007, 11:45 p.m.)
Deposited	1 year, 6 months ago (Feb. 14, 2024, 9:17 a.m.)
Indexed	1 hour, 2 minutes ago (Aug. 20, 2025, 8:23 p.m.)
Issued	18 years, 2 months ago (May 23, 2007)
Published	18 years, 2 months ago (May 23, 2007)
Published Online	18 years, 2 months ago (May 23, 2007)
Published Print	18 years, 2 months ago (June 1, 2007)

Funders 0

None

BibTeX

@article{HAYLES_2007, title={A technique for improved focused ion beam milling of cryo‐prepared life science specimens}, volume={226}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.2007.01775.x}, DOI={10.1111/j.1365-2818.2007.01775.x}, number={3}, journal={Journal of Microscopy}, publisher={Wiley}, author={HAYLES, M. F. and STOKES, D. J. and PHIFER, D. and FINDLAY, K. C.}, year={2007}, month=may, pages={263–269} }

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