DOI: 10.1111/j.1365-2818.2006.01603.x. Electron microscopy and diffraction of radiation‐sensitive nanostructured materials

Electron microscopy and diffraction of radiation‐sensitive nanostructured materials

10.1111/j.1365-2818.2006.01603.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SummarySoft matter research of natural organic and synthetic nanomaterials is an area in nanoscience and technology that has been growing particularly quickly in recent years. The materials under investigation are sensitive to high‐energy electrons. Any structure characterization using electron microscopy thus requires special care. First, we illustrated this on naturally grown nanotubes observed by normal and cryogenic scanning electron microscopy. Second, we studied the ordering and orientation of the mesophase in template‐grown nanotubes and nanorods containing discotic liquid crystals without and with doping, as desired. For these studies, we mainly used transmission electron diffraction and microscopy at low‐dose conditions, high‐efficiency image acquisition, and cryoprotection of the structures at liquid helium temperature. Additional analytical information was obtained by electron energy filtering observations.

Bibliography

SCHAPER, A. K., YOSHIOKA, T., OGAWA, T., & TSUJI, M. (2006). Electron microscopy and diffraction of radiationâsensitive nanostructured materials. Journal of Microscopy, 223(2), 88â95. Portico.

Authors 4

A. K. SCHAPER (first)
T. YOSHIOKA (additional)
T. OGAWA (additional)
M. TSUJI (additional)

References 45 Referenced 5

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Dates

Type	When
Created	19 years ago (Aug. 10, 2006, 8:30 a.m.)
Deposited	1 year, 10 months ago (Oct. 12, 2023, 11:30 a.m.)
Indexed	1 year, 3 months ago (May 7, 2024, 4:15 p.m.)
Issued	19 years ago (Aug. 1, 2006)
Published	19 years ago (Aug. 1, 2006)
Published Online	19 years ago (Aug. 10, 2006)
Published Print	19 years ago (Aug. 1, 2006)

Funders 0

None

BibTeX

@article{SCHAPER_2006, title={Electron microscopy and diffraction of radiation‐sensitive nanostructured materials}, volume={223}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.2006.01603.x}, DOI={10.1111/j.1365-2818.2006.01603.x}, number={2}, journal={Journal of Microscopy}, publisher={Wiley}, author={SCHAPER, A. K. and YOSHIOKA, T. and OGAWA, T. and TSUJI, M.}, year={2006}, month=aug, pages={88–95} }

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