DOI: 10.1111/j.1365-2818.1995.tb03678.x. Recent developments in secondary electron imaging

Recent developments in secondary electron imaging

10.1111/j.1365-2818.1995.tb03678.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SUMMARYSome recent experimental and theoretical developments in secondary electron (SE) imaging are reviewed. Coincidence experiments identify inner‐shell excitations and single electron valence excitations often as more significant initial events in SE production than the more delocalized process of plasmon generation. Quantitative measurement and interpretation of escape depths in different materials are now becoming possible. Local variations in surface barrier height or work function can be imaged, e.g. at p‐n junctions in semiconductors, especially if the effects of external patch fields are overcome.

Bibliography

HOWIE, A. (1995). Recent developments in secondary electron imaging. Journal of Microscopy, 180(3), 192â203. Portico.

Authors 1

A. HOWIE (first)

References 45 Referenced 64

10.1016/0039-6028(79)90109-2
10.1063/1.1660887
10.1016/0304-3991(94)90109-0
10.1016/0304-3991(89)90039-9
10.1007/3-540-08685-4
10.1016/S0081-1947(08)60728-6
10.1103/PhysRevB.47.15973
10.1063/1.355000
10.1063/1.323085
10.1016/0039-6028(85)90657-0
10.1063/1.109098
10.1016/0304-3991(85)90161-5
10.1016/0304-3991(85)90091-9
{'key': 'e_1_2_1_15_1', 'first-page': '389', 'article-title': 'In‐situ electron microscopy of GaAs MBE monolayer growth', 'volume': '117', 'author': 'Inoue N.', 'year': '1991', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. / In‐situ electron microscopy of GaAs MBE monolayer growth by Inoue N. (1991)
10.1016/0039-6028(85)90115-3
10.1016/0039-6028(80)90276-9
10.1103/PhysRev.159.624
{'key': 'e_1_2_1_19_1', 'first-page': '271', 'article-title': 'Coincidence methods in STEM', 'volume': '1', 'author': 'Kruit P.', 'year': '1989', 'journal-title': 'Proc. EMAG-MICRO 1989'} / Proc. EMAG-MICRO 1989 / Coincidence methods in STEM by Kruit P. (1989)
{'key': 'e_1_2_1_20_1', 'first-page': '911', 'article-title': 'Observations of tungsten field emitter tips with an ultra high resolution SEM', 'volume': '1', 'author': 'Kuroda K.', 'year': '1987', 'journal-title': 'Scanning Microsc.'} / Scanning Microsc. / Observations of tungsten field emitter tips with an ultra high resolution SEM by Kuroda K. (1987)
10.1016/0304-3991(87)90257-9
{'key': 'e_1_2_1_22_1', 'first-page': '1957', 'article-title': 'Contrast and resolution of secondary electron images in a scanning transmission electron microscope', 'volume': '2', 'author': 'Liu J.', 'year': '1988', 'journal-title': 'Scanning Microsc.'} / Scanning Microsc. / Contrast and resolution of secondary electron images in a scanning transmission electron microscope by Liu J. (1988)
10.1063/1.327300
10.1111/j.1365-2818.1985.tb02630.x
{'key': 'e_1_2_1_25_1', 'article-title': 'Study of ‘wet’ polymer latex systems in environmental scanning electron microscopy: some imaging considerations', 'author': 'Meredith P.', 'year': '1995', 'journal-title': 'J. Microsc.'} / J. Microsc. / Study of ‘wet’ polymer latex systems in environmental scanning electron microscopy: some imaging considerations by Meredith P. (1995)
10.1016/0304-3991(89)90012-0
10.1016/0304-3991(93)90047-2
{'key': 'e_1_2_1_28_1', 'first-page': '901', 'article-title': 'Development of an ultra‐high resolution scanning electron microscope by means of a field emission source and in‐lens system', 'volume': '1', 'author': 'Nagatani T.', 'year': '1987', 'journal-title': 'Scanning Microsc.'} / Scanning Microsc. / Development of an ultra‐high resolution scanning electron microscope by means of a field emission source and in‐lens system by Nagatani T. (1987)
10.1016/0304-3991(91)90142-S
10.1557/PROC-159-33
Overdick M.&Bleloch A.L.(1993)Coincidence experiments on the secondary electron emission from copper particles and oxidised aluminium. Proc. EMAG 1993 91–94.
{'key': 'e_1_2_1_32_1', 'first-page': '91', 'article-title': 'Doping layer imaging in the field emission scanning electron microscope', 'volume': '1', 'author': 'Perovic D.D.', 'year': '1994', 'journal-title': 'Proc. ICEM 13-Paris'} / Proc. ICEM 13-Paris / Doping layer imaging in the field emission scanning electron microscope by Perovic D.D. (1994)
{'key': 'e_1_2_1_33_1', 'article-title': 'Field emission SEM imaging of compositional and doping layer semiconductor superlattices', 'author': 'Perovic D.D.', 'year': '1955', 'journal-title': 'Ultramicroscopy'} / Ultramicroscopy / Field emission SEM imaging of compositional and doping layer semiconductor superlattices by Perovic D.D. (1955)
10.1103/PhysRevB.44.9192
{'key': 'e_1_2_1_35_1', 'first-page': '155', 'volume-title': 'Computational Approaches to Molecular Biology', 'author': 'Ritchie R.H.', 'year': '1995'} / Computational Approaches to Molecular Biology by Ritchie R.H. (1995)
10.1007/BFb0041377
10.1016/0039-6028(93)90965-M
10.1007/BF00570528
10.1103/PhysRevB.47.4068
{'key': 'e_1_2_1_40_1', 'first-page': '607', 'article-title': 'Secondary electron emission from solids by electron and proton impact', 'volume': '2', 'author': 'Schou J.', 'year': '1988', 'journal-title': 'Scanning Microsc.'} / Scanning Microsc. / Secondary electron emission from solids by electron and proton impact by Schou J. (1988)
10.1063/1.332840
10.1103/PhysRev.108.1
10.1016/0039-6028(76)90320-4
10.1016/0304-3991(92)90040-Q
{'key': 'e_1_2_1_45_1', 'volume-title': 'Scanning Electron Microscopy.', 'author': 'Wells O.C.', 'year': '1974'} / Scanning Electron Microscopy. by Wells O.C. (1974)
10.1116/1.578374

Dates

Type	When
Created	14 years, 1 month ago (Aug. 2, 2011, 6:54 a.m.)
Deposited	1 year, 11 months ago (Sept. 27, 2023, 10:08 p.m.)
Indexed	4 months, 2 weeks ago (April 19, 2025, 10:47 a.m.)
Issued	29 years, 9 months ago (Dec. 1, 1995)
Published	29 years, 9 months ago (Dec. 1, 1995)
Published Online	14 years, 1 month ago (Aug. 2, 2011)
Published Print	29 years, 9 months ago (Dec. 1, 1995)

Funders 0

None

BibTeX

@article{HOWIE_1995, title={Recent developments in secondary electron imaging}, volume={180}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1995.tb03678.x}, DOI={10.1111/j.1365-2818.1995.tb03678.x}, number={3}, journal={Journal of Microscopy}, publisher={Wiley}, author={HOWIE, A.}, year={1995}, month=dec, pages={192–203} }

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