DOI: 10.1111/j.1365-2818.1993.tb03363.x. Near‐field optical microscopy in transmission and reflection modes in combination with force microscopy

Near‐field optical microscopy in transmission and reflection modes in combination with force microscopy

10.1111/j.1365-2818.1993.tb03363.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SummaryNear‐field optical microscopy is the optical alternative of the various types of scanning probe microscopes. The technique overcomes the classical diffraction limit in conventional optical microscopy. In this paper the concepts of near‐field optics (NFO) are introduced, followed by a short review of current trends in NFO microscopy. Specifically, developments concerning the efficiency and versatility of both aperture and dielectric probe types are discussed. We present our advances in NFO microscopy, using both fibres and integrated silicon nitride (SiN) structures as dielectric probes. The use of an SiN probe as a combined optical and force sensor is shown to be advantageous, as it provides a feedback mechanism and allows direct comparison between topography and dielectric effects. Images of technical and biological samples are presented with a lateral resolution down to 20 nm, depending on the microscopical arrangement used.

Bibliography

VAN HULST, N. F., MOERS, M. H. P., & BÃLGER, B. (1993). Nearâfield optical microscopy in transmission and reflection modes in combination with force microscopy. Journal of Microscopy, 171(2), 95â105. Portico.

Authors 3

N. F. VAN HULST (first)
M. H. P. MOERS (additional)
B. BÖLGER (additional)

References 44 Referenced 70

10.1038/237510a0
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{'key': 'e_1_2_1_36_1', 'volume-title': 'Proc. Int. Workshop on Near Field Optical and Related Techniques.', 'author': 'Pohl D.W.', 'year': '1993'} / Proc. Int. Workshop on Near Field Optical and Related Techniques. by Pohl D.W. (1993)
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Dates

Type	When
Created	14 years ago (Aug. 2, 2011, 10:10 a.m.)
Deposited	1 year, 9 months ago (Oct. 25, 2023, 10:18 p.m.)
Indexed	1 year ago (Aug. 13, 2024, 1:31 p.m.)
Issued	32 years ago (Aug. 1, 1993)
Published	32 years ago (Aug. 1, 1993)
Published Online	14 years ago (Aug. 2, 2011)
Published Print	32 years ago (Aug. 1, 1993)

Funders 0

None

BibTeX

@article{VAN_HULST_1993, title={Near‐field optical microscopy in transmission and reflection modes in combination with force microscopy}, volume={171}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1993.tb03363.x}, DOI={10.1111/j.1365-2818.1993.tb03363.x}, number={2}, journal={Journal of Microscopy}, publisher={Wiley}, author={VAN HULST, N. F. and MOERS, M. H. P. and BÖLGER, B.}, year={1993}, month=aug, pages={95–105} }

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