DOI: 10.1111/j.1365-2818.1991.tb03090.x. Contrast analysis of cryo‐images of <i>n</i>‐paraffin recorded at 400***kV out to 2·1 Å resolution

Contrast analysis of cryo‐images of n‐paraffin recorded at 400***kV out to 2·1 Å resolution

10.1111/j.1365-2818.1991.tb03090.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SUMMARYN‐Paraffin was used as a test specimen for evaluating the relative merits of 400‐kV versus 100‐kV electron microscopy in recording data for electron crystallographic analysis of beam‐sensitive materials. The parameter used for comparison, the relative contrast R, is the ratio of amplitudes from the computed Fourier transform of images and amplitudes from an electron diffraction pattern from the same crystal. R will thus be a measure of the contrast from an experimental image relative to that of a perfect image. Electron diffraction patterns and bright‐field images were recorded at 400 kV at a specimen temperature of −167°C. Using the flood‐beam imaging technique the best R‐value is 0 08 for all reflections in the resolution zone from 4 to 3 Å. This value is equivalent to that found at 100 kV. In the resolution zone from 3 to 2 Å we have found R — 0 02. Using the spot‐scan imaging technique, on the other hand, R was measured to be 0·42 for the reflections between 4‐ and 3‐Å resolution. This amount of relative contrast is 1·7 times that observed at 100 kV. Reflections at 3–2 Å displayed an R‐value of 0 05. Besides obtaining higher R‐values when applying the spot‐scan imaging technique at 400 kV, we observe a higher yield of images with isotropic diffraction and/or higher resolution reflections. Various contrast‐attenuating factors, including the modulation transfer function of the photographic film and the cryo‐holder, envelope functions for spatial and temporal coherence and lens and high‐tension instabilities, the contrast transfer function and lastly the radiation damage effects, have been considered in interpreting the observed image contrast. Overall, use of 400 kV in combination with spot‐scan does offer important improvements in contrast levels, which can be very useful in determining the three‐dimensional structure from protein crystals.

Bibliography

Brink, J., & Chiu, W. (1991). Contrast analysis of cryoâimages of nâparaffin recorded at 400***kV out to 2Â·1 Ã resolution. Journal of Microscopy, 161(2), 279â295. Portico.

Authors 2

J. Brink (first)
W. Chiu (additional)

References 38 Referenced 23

10.1016/0304-3991(84)90217-1
10.1016/0022-2836(88)90288-4
10.1016/0304-3991(87)90147-1
10.1016/S0022-2836(05)80101-9
10.1016/S0304-3991(76)91334-6
10.1111/j.1749-6632.1986.tb34510.x
10.1016/0304-3991(84)90090-1
{'key': 'e_1_2_1_9_1', 'first-page': '147', 'volume-title': 'Proc. 3rd Int. Conf. on High Voltage Electron Microscopy', 'author': 'Cosslett V.E.', 'year': '1974'} / Proc. 3rd Int. Conf. on High Voltage Electron Microscopy by Cosslett V.E. (1974)
10.1016/0304-3991(85)90089-0
10.1016/0892-0354(90)90002-A
10.1016/0304-3991(86)90191-9
10.1016/0304-3991(82)90262-5
10.1002/bbpc.19700741109
{'key': 'e_1_2_1_15_1', 'first-page': '171', 'article-title': 'Detection of object movement in optical diffractograms of electron micrographs', 'volume': '30', 'author': 'Frank J.', 'year': '1969', 'journal-title': 'Optik'} / Optik / Detection of object movement in optical diffractograms of electron micrographs by Frank J. (1969)
{'key': 'e_1_2_1_16_1', 'first-page': '519', 'article-title': 'The envelope of electron microscopic transfer functions for partially coherent illumination', 'volume': '38', 'author': 'Frank J.', 'year': '1973', 'journal-title': 'Optik'} / Optik / The envelope of electron microscopic transfer functions for partially coherent illumination by Frank J. (1973)
{'key': 'e_1_2_1_17_1', 'first-page': '379', 'article-title': "Determination of source size and energy spread from electron micrographs using the method of Young's fringes", 'volume': '44', 'author': 'Frank J.', 'year': '1976', 'journal-title': 'Optik'} / Optik / Determination of source size and energy spread from electron micrographs using the method of Young's fringes by Frank J. (1976)
10.1016/S0022-5320(71)80118-1
10.1146/annurev.pc.36.100185.001331
10.1016/S0304-3991(79)90211-0
10.1016/0022-2836(81)90007-3
10.1016/0304-3991(86)90203-2
10.1016/S0022-2836(05)80271-2
10.1016/0304-3991(85)90069-5
10.1111/j.1365-2818.1986.tb02731.x
{'key': 'e_1_2_1_26_1', 'first-page': '1', 'volume-title': 'Principles and Techniques of Electron Microscopy', 'author': 'Isaacson M.S.', 'year': '1977'} / Principles and Techniques of Electron Microscopy by Isaacson M.S. (1977)
10.1016/1047-8477(90)90086-R
10.1016/0022-2836(83)90080-3
10.1016/0022-2836(89)90379-3
10.1016/0022-2836(89)90247-7
10.1002/j.1460-2075.1984.tb01768.x
10.1016/0022-2836(88)90247-1
10.1515/zna-1972-0219 / Z. Naturf. / Der Einfluß tiefer Temperaturen auf die Strahlenschädigung von organischen Kristallen durch 100 keV Elektronen by Siegel G. (1972)
{'key': 'e_1_2_1_34_1', 'volume-title': 'Experimental High‐Resolution Electron Microscopy', 'author': 'Spence J.C.H.', 'year': '1988'} / Experimental High‐Resolution Electron Microscopy by Spence J.C.H. (1988)
10.1107/S0365110X59000901
{'key': 'e_1_2_1_36_1', 'first-page': '81', 'article-title': 'Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread', 'volume': '49', 'author': 'Wade R.H.', 'year': '1977', 'journal-title': 'Optik'} / Optik / Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread by Wade R.H. (1977)
10.1016/0304-3991(82)90049-3
{'key': 'e_1_2_1_38_1', 'first-page': '241', 'volume-title': 'Proc. Eighth Eur. Cong. on Electron Microscopy Vol. 1 Instrumentation, Physics and Material Science, Applications I', 'author': 'Zemlin F.', 'year': '1984'} / Proc. Eighth Eur. Cong. on Electron Microscopy Vol. 1 Instrumentation, Physics and Material Science, Applications I by Zemlin F. (1984)
{'key': 'e_1_2_1_39_1', 'first-page': '10', 'volume-title': 'Proc. 44th Ann. Meeting EMSA', 'author': 'Zemlin F.', 'year': '1986'} / Proc. 44th Ann. Meeting EMSA by Zemlin F. (1986)

Dates

Type	When
Created	14 years, 1 month ago (Aug. 2, 2011, 1:17 p.m.)
Deposited	1 year, 10 months ago (Oct. 23, 2023, 3:12 a.m.)
Indexed	1 year, 4 months ago (April 9, 2024, 10:13 p.m.)
Issued	34 years, 7 months ago (Feb. 1, 1991)
Published	34 years, 7 months ago (Feb. 1, 1991)
Published Online	14 years, 1 month ago (Aug. 2, 2011)
Published Print	34 years, 7 months ago (Feb. 1, 1991)

Funders 0

None

BibTeX

@article{Brink_1991, title={Contrast analysis of cryo‐images of n‐paraffin recorded at 400***kV out to 2·1 Å resolution}, volume={161}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1991.tb03090.x}, DOI={10.1111/j.1365-2818.1991.tb03090.x}, number={2}, journal={Journal of Microscopy}, publisher={Wiley}, author={Brink, J. and Chiu, W.}, year={1991}, month=feb, pages={279–295} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        4,
        10
      ]
    ],
    "date-time": "2024-04-10T02:13:11Z",
    "timestamp": 1712715191801
  },
  "reference-count": 38,
  "publisher": "Wiley",
  "issue": "2",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2011,
            8,
            2
          ]
        ],
        "date-time": "2011-08-02T00:00:00Z",
        "timestamp": 1312243200000
      },
      "content-version": "vor",
      "delay-in-days": 7487,
      "URL": "http://onlinelibrary.wiley.com/termsAndConditions#vor"
    }
  ],
  "content-domain": {
    "domain": [
      "onlinelibrary.wiley.com"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1991,
        2
      ]
    ]
  },
  "abstract": "<jats:title>SUMMARY</jats:title><jats:p><jats:italic>N</jats:italic>\u2010Paraffin was used as a test specimen for evaluating the relative merits of 400\u2010kV versus 100\u2010kV electron microscopy in recording data for electron crystallographic analysis of beam\u2010sensitive materials. The parameter used for comparison, the relative contrast <jats:italic>R</jats:italic>, is the ratio of amplitudes from the computed Fourier transform of images and amplitudes from an electron diffraction pattern from the same crystal. <jats:italic>R</jats:italic> will thus be a measure of the contrast from an experimental image relative to that of a perfect image. Electron diffraction patterns and bright\u2010field images were recorded at 400 kV at a specimen temperature of \u2212167\u00b0C. Using the flood\u2010beam imaging technique the best <jats:italic>R</jats:italic>\u2010value is 0 08 for all reflections in the resolution zone from 4 to 3 \u00c5. This value is equivalent to that found at 100 kV. In the resolution zone from 3 to 2 \u00c5 we have found <jats:italic>R \u2014</jats:italic> 0 02. Using the spot\u2010scan imaging technique, on the other hand, <jats:italic>R</jats:italic> was measured to be 0\u00b742 for the reflections between 4\u2010 and 3\u2010\u00c5 resolution. This amount of relative contrast is 1\u00b77 times that observed at 100 kV. Reflections at 3\u20132 \u00c5 displayed an <jats:italic>R</jats:italic>\u2010value of 0 05. Besides obtaining higher <jats:italic>R</jats:italic>\u2010values when applying the spot\u2010scan imaging technique at 400 kV, we observe a higher yield of images with isotropic diffraction and/or higher resolution reflections. Various contrast\u2010attenuating factors, including the modulation transfer function of the photographic film and the cryo\u2010holder, envelope functions for spatial and temporal coherence and lens and high\u2010tension instabilities, the contrast transfer function and lastly the radiation damage effects, have been considered in interpreting the observed image contrast. Overall, use of 400 kV in combination with spot\u2010scan does offer important improvements in contrast levels, which can be very useful in determining the three\u2010dimensional structure from protein crystals.</jats:p>",
  "DOI": "10.1111/j.1365-2818.1991.tb03090.x",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2011,
        8,
        2
      ]
    ],
    "date-time": "2011-08-02T17:17:03Z",
    "timestamp": 1312305423000
  },
  "page": "279-295",
  "update-policy": "http://dx.doi.org/10.1002/crossmark_policy",
  "source": "Crossref",
  "is-referenced-by-count": 23,
  "title": "Contrast analysis of cryo\u2010images of <i>n</i>\u2010paraffin recorded at 400***kV out to 2\u00b71 \u00c5 resolution",
  "prefix": "10.1111",
  "volume": "161",
  "author": [
    {
      "given": "J.",
      "family": "Brink",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "W.",
      "family": "Chiu",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "311",
  "published-online": {
    "date-parts": [
      [
        2011,
        8,
        2
      ]
    ]
  },
  "reference": [
    {
      "key": "e_1_2_1_2_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(84)90217-1"
    },
    {
      "key": "e_1_2_1_3_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0022-2836(88)90288-4"
    },
    {
      "key": "e_1_2_1_4_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(87)90147-1"
    },
    {
      "key": "e_1_2_1_5_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0022-2836(05)80101-9"
    },
    {
      "key": "e_1_2_1_6_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0304-3991(76)91334-6"
    },
    {
      "key": "e_1_2_1_7_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1111/j.1749-6632.1986.tb34510.x"
    },
    {
      "key": "e_1_2_1_8_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(84)90090-1"
    },
    {
      "key": "e_1_2_1_9_1",
      "first-page": "147",
      "volume-title": "Proc. 3rd Int. Conf. on High Voltage Electron Microscopy",
      "author": "Cosslett V.E.",
      "year": "1974"
    },
    {
      "key": "e_1_2_1_10_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(85)90089-0"
    },
    {
      "key": "e_1_2_1_11_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0892-0354(90)90002-A"
    },
    {
      "key": "e_1_2_1_12_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(86)90191-9"
    },
    {
      "key": "e_1_2_1_13_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(82)90262-5"
    },
    {
      "key": "e_1_2_1_14_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/bbpc.19700741109"
    },
    {
      "key": "e_1_2_1_15_1",
      "first-page": "171",
      "article-title": "Detection of object movement in optical diffractograms of electron micrographs",
      "volume": "30",
      "author": "Frank J.",
      "year": "1969",
      "journal-title": "Optik"
    },
    {
      "key": "e_1_2_1_16_1",
      "first-page": "519",
      "article-title": "The envelope of electron microscopic transfer functions for partially coherent illumination",
      "volume": "38",
      "author": "Frank J.",
      "year": "1973",
      "journal-title": "Optik"
    },
    {
      "key": "e_1_2_1_17_1",
      "first-page": "379",
      "article-title": "Determination of source size and energy spread from electron micrographs using the method of Young's fringes",
      "volume": "44",
      "author": "Frank J.",
      "year": "1976",
      "journal-title": "Optik"
    },
    {
      "key": "e_1_2_1_18_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0022-5320(71)80118-1"
    },
    {
      "key": "e_1_2_1_19_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1146/annurev.pc.36.100185.001331"
    },
    {
      "key": "e_1_2_1_20_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0304-3991(79)90211-0"
    },
    {
      "key": "e_1_2_1_21_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0022-2836(81)90007-3"
    },
    {
      "key": "e_1_2_1_22_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(86)90203-2"
    },
    {
      "key": "e_1_2_1_23_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0022-2836(05)80271-2"
    },
    {
      "key": "e_1_2_1_24_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(85)90069-5"
    },
    {
      "key": "e_1_2_1_25_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1111/j.1365-2818.1986.tb02731.x"
    },
    {
      "key": "e_1_2_1_26_1",
      "first-page": "1",
      "volume-title": "Principles and Techniques of Electron Microscopy",
      "author": "Isaacson M.S.",
      "year": "1977"
    },
    {
      "key": "e_1_2_1_27_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/1047-8477(90)90086-R"
    },
    {
      "key": "e_1_2_1_28_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0022-2836(83)90080-3"
    },
    {
      "key": "e_1_2_1_29_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0022-2836(89)90379-3"
    },
    {
      "key": "e_1_2_1_30_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0022-2836(89)90247-7"
    },
    {
      "key": "e_1_2_1_31_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/j.1460-2075.1984.tb01768.x"
    },
    {
      "key": "e_1_2_1_32_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0022-2836(88)90247-1"
    },
    {
      "key": "e_1_2_1_33_1",
      "doi-asserted-by": "crossref",
      "first-page": "325",
      "DOI": "10.1515/zna-1972-0219",
      "article-title": "Der Einflu\u00df tiefer Temperaturen auf die Strahlensch\u00e4digung von organischen Kristallen durch 100 keV Elektronen",
      "volume": "27",
      "author": "Siegel G.",
      "year": "1972",
      "journal-title": "Z. Naturf."
    },
    {
      "key": "e_1_2_1_34_1",
      "volume-title": "Experimental High\u2010Resolution Electron Microscopy",
      "author": "Spence J.C.H.",
      "year": "1988"
    },
    {
      "key": "e_1_2_1_35_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1107/S0365110X59000901"
    },
    {
      "key": "e_1_2_1_36_1",
      "first-page": "81",
      "article-title": "Electron microscope transfer functions for partially coherent axial illumination and chromatic defocus spread",
      "volume": "49",
      "author": "Wade R.H.",
      "year": "1977",
      "journal-title": "Optik"
    },
    {
      "key": "e_1_2_1_37_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0304-3991(82)90049-3"
    },
    {
      "key": "e_1_2_1_38_1",
      "first-page": "241",
      "volume-title": "Proc. Eighth Eur. Cong. on Electron Microscopy Vol. 1 Instrumentation, Physics and Material Science, Applications I",
      "author": "Zemlin F.",
      "year": "1984"
    },
    {
      "key": "e_1_2_1_39_1",
      "first-page": "10",
      "volume-title": "Proc. 44th Ann. Meeting EMSA",
      "author": "Zemlin F.",
      "year": "1986"
    }
  ],
  "container-title": "Journal of Microscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fj.1365-2818.1991.tb03090.x",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://onlinelibrary.wiley.com/doi/pdf/10.1111/j.1365-2818.1991.tb03090.x",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        10,
        23
      ]
    ],
    "date-time": "2023-10-23T07:12:40Z",
    "timestamp": 1698045160000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://onlinelibrary.wiley.com/doi/10.1111/j.1365-2818.1991.tb03090.x"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1991,
        2
      ]
    ]
  },
  "references-count": 38,
  "journal-issue": {
    "issue": "2",
    "published-print": {
      "date-parts": [
        [
          1991,
          2
        ]
      ]
    }
  },
  "alternative-id": [
    "10.1111/j.1365-2818.1991.tb03090.x"
  ],
  "URL": "http://dx.doi.org/10.1111/j.1365-2818.1991.tb03090.x",
  "relation": {},
  "ISSN": [
    "0022-2720",
    "1365-2818"
  ],
  "subject": [],
  "container-title-short": "Journal of Microscopy",
  "published": {
    "date-parts": [
      [
        1991,
        2
      ]
    ]
  },
  "assertion": [
    {
      "value": "2011-08-02",
      "order": 2,
      "name": "published",
      "label": "Published",
      "group": {
        "name": "publication_history",
        "label": "Publication History"
      }
    }
  ]
}