10.1111/j.1365-2818.1988.tb01449.x
Crossref journal-article
Wiley
Journal of Microscopy (311)
Abstract

SUMMARYTheoretical studies have been done on graphite with a vacancy using the extended Huckel tight‐binding (EHTB) method. The results of the singly‐ and doubly‐layered samples show that there is an unexpected distance dependence of the charge density directly over the vacancy. Furthermore, the vacancy acts as a perturbation to distinguish two sublattices which exist in pristine graphite and it creates a charge enhancement in the atoms directly surrounding it.

Bibliography

Soto, M. R. (1988). The effect of a vacancy on the STM image of graphite. Journal of Microscopy, 152(3), 779–788. Portico.

Authors 1
  1. M. R. Soto (first)
References 8 Referenced 18
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Dates
Type When
Created 14 years ago (Aug. 2, 2011, 12:38 p.m.)
Deposited 1 year, 10 months ago (Oct. 21, 2023, 2:33 a.m.)
Indexed 1 year, 6 months ago (Feb. 10, 2024, 9:23 p.m.)
Issued 36 years, 8 months ago (Dec. 1, 1988)
Published 36 years, 8 months ago (Dec. 1, 1988)
Published Online 14 years ago (Aug. 2, 2011)
Published Print 36 years, 8 months ago (Dec. 1, 1988)
Funders 0

None

@article{Soto_1988, title={The effect of a vacancy on the STM image of graphite}, volume={152}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1988.tb01449.x}, DOI={10.1111/j.1365-2818.1988.tb01449.x}, number={3}, journal={Journal of Microscopy}, publisher={Wiley}, author={Soto, M. R.}, year={1988}, month=dec, pages={779–788} }