DOI: 10.1111/j.1365-2818.1987.tb02816.x. Influence of some practical factors on background extrapolation in EELS quantification

Influence of some practical factors on background extrapolation in EELS quantification

10.1111/j.1365-2818.1987.tb02816.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SUMMARYThe detectability of a minor element with EELS in a STEM is of great interest. This paper first describes errors resulting from a conventional background extrapolation scheme and other faults in the collected spectra which in effect greatly reduce the seemingly good signal to noise ratio of a spectrum and therefore impose much more stringent statistical counting requirement on spectra if a small amount of element is to be quantified with good accuracy. Secondly, the systematic variation of the index r of the power law background fitting curve of an ionizatoin edge tail is discussed. Its effect on the detectability of a minor element is analysed. It puts a lower limit on the detectability of an element, however many counts are accumulated. Also a scheme is proposed of some non‐conventional linear least squares fits by which one might suffer from less quantification error due to background extrapolation and achieve lower detectability of a minor element.

Bibliography

Liu, D., & Brown, L. M. (1987). Influence of some practical factors on background extrapolation in EELS quantification. Journal of Microscopy, 147(1), 37â49. Portico.

Authors 2

D‐R. Liu (first)
L. M. Brown (additional)

References 23 Referenced 27

Bentley J. Lehman G.L.&Skland P.S.(1982)Improved background fitting for electron energy loss spectra. Electron Microscopy 1982 Proc. 10th International Congress on Electron Microscopy Vol. 1 p.585. Hamburg.
10.1038/298635a0
{'key': 'e_1_2_1_4_1', 'volume-title': 'Data Reduction and Error Analysis for the Physical Sciences.', 'author': 'Bevington P.R.', 'year': '1969'} / Data Reduction and Error Analysis for the Physical Sciences. by Bevington P.R. (1969)
{'key': 'e_1_2_1_5_1', 'first-page': '251', 'volume-title': 'Microprobe Analysis of Biological System', 'author': 'Colliex C.', 'year': '1981'} / Microprobe Analysis of Biological System by Colliex C. (1981)
{'key': 'e_1_2_1_6_1', 'first-page': '41', 'volume-title': 'SEM/1980', 'author': 'Egerton R.F.', 'year': '1980'} / SEM/1980 by Egerton R.F. (1980)
10.1016/S0304-3991(81)80166-0
{'key': 'e_1_2_1_8_1', 'first-page': '488', 'volume-title': 'Signal/noise ratio and elemental detectivity by EELS', 'author': 'Egerton R.F.', 'year': '1982'} / Signal/noise ratio and elemental detectivity by EELS by Egerton R.F. (1982)
10.1016/0304-3991(82)90101-2
{'key': 'e_1_2_1_10_1', 'volume-title': 'Electron Energy‐Loss Spectroscopy in the Electron Microscope', 'author': 'Egerton R.F.', 'year': '1986'} / Electron Energy‐Loss Spectroscopy in the Electron Microscope by Egerton R.F. (1986)
10.1103/RevModPhys.40.441
10.1103/RevModPhys.43.297
10.1016/S0304-3991(75)80006-4
{'key': 'e_1_2_1_14_1', 'first-page': '110', 'volume-title': "A poor man's approach to semi‐quantitative analysis with electron energy loss spectroscopy", 'author': 'Isaacson M.S.', 'year': '1980'} / A poor man's approach to semi‐quantitative analysis with electron energy loss spectroscopy by Isaacson M.S. (1980)
{'key': 'e_1_2_1_15_1', 'first-page': '98', 'volume-title': 'Microbeam Analysis/1982', 'author': 'Joy D.C.', 'year': '1982'} / Microbeam Analysis/1982 by Joy D.C. (1982)
10.1016/0304-3991(80)90037-6
{'key': 'e_1_2_1_17_1', 'first-page': '163', 'volume-title': 'Microbeam Analysis/1983', 'author': 'Leapman R.D.', 'year': '1983'} / Microbeam Analysis/1983 by Leapman R.D. (1983)
10.1021/ac60104a014
{'key': 'e_1_2_1_19_1', 'first-page': '201', 'volume-title': 'Minimum detectable atomic fractions of carbon and oxygen in iron', 'author': 'Liu D.R.', 'year': '1981'} / Minimum detectable atomic fractions of carbon and oxygen in iron by Liu D.R. (1981)
{'key': 'e_1_2_1_20_1', 'first-page': '156', 'volume-title': 'Microbeam Analysis/1983', 'author': 'Pun T.', 'year': '1983'} / Microbeam Analysis/1983 by Pun T. (1983)
10.1111/j.1365-2818.1984.tb02535.x
10.1063/1.1138336
{'key': 'e_1_2_1_23_1', 'volume-title': 'Practical Physics.', 'author': 'Squires G.L.', 'year': '1976'} / Practical Physics. by Squires G.L. (1976)
{'key': 'e_1_2_1_24_1', 'first-page': '1', 'volume-title': 'Microbeam Analysis/1982', 'author': 'Statham P.J.', 'year': '1982'} / Microbeam Analysis/1982 by Statham P.J. (1982)

Dates

Type	When
Created	14 years ago (Aug. 2, 2011, 1:52 p.m.)
Deposited	1 year, 10 months ago (Oct. 20, 2023, 3:20 p.m.)
Indexed	1 year ago (Aug. 7, 2024, 1:12 p.m.)
Issued	38 years, 1 month ago (July 1, 1987)
Published	38 years, 1 month ago (July 1, 1987)
Published Online	14 years ago (Aug. 2, 2011)
Published Print	38 years, 1 month ago (July 1, 1987)

Funders 0

None

BibTeX

@article{Liu_1987, title={Influence of some practical factors on background extrapolation in EELS quantification}, volume={147}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1987.tb02816.x}, DOI={10.1111/j.1365-2818.1987.tb02816.x}, number={1}, journal={Journal of Microscopy}, publisher={Wiley}, author={Liu, D‐R. and Brown, L. M.}, year={1987}, month=jul, pages={37–49} }

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