DOI: 10.1111/j.1365-2818.1986.tb02804.x. Elemental mapping with elastically scattered electrons

Elemental mapping with elastically scattered electrons

10.1111/j.1365-2818.1986.tb02804.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SUMMARYWe describe a technique for efficient, quantitative, standardless elemental mapping using a high‐angle annular detector in a scanning transmission electron microscope (STEM) to collect elastically scattered electrons. With a single crystal specimen, contrast due to thickness variations, diffraction, and channelling effects can be avoided, so that the resulting image contrast quantitatively reflects variations in impurity concentration. We compare a number of simple analytical approximations to the elastic scattering cross sections and show that a standardless analysis is possible over a wide range of atomic number and inner detector angle to an absolute accuracy of better than 20%.

Bibliography

Pennycook, S. J., Berger, S. D., & Culbertson, R. J. (1986). Elemental mapping with elastically scattered electrons. Journal of Microscopy, 144(3), 229â249. Portico.

Authors 3

S. J. Pennycook (first)
S. D. Berger (additional)
R. J. Culbertson (additional)

References 57 Referenced 103

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{'key': 'e_1_2_1_52_1', 'first-page': '511', 'article-title': 'Optimizing atomic number contrast in annular dark field images of thin films in the scanning transmission electron microscope', 'volume': '7', 'author': 'Treacy M.M.J.', 'year': '1982', 'journal-title': 'J. Microsc. Spectrosc. Electron.'} / J. Microsc. Spectrosc. Electron. / Optimizing atomic number contrast in annular dark field images of thin films in the scanning transmission electron microscope by Treacy M.M.J. (1982)
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{'key': 'e_1_2_1_54_1', 'first-page': '261', 'volume-title': 'Electron Microscopy and Analysis 1979', 'author': 'Treacy M.M.J.', 'year': '1980'} / Electron Microscopy and Analysis 1979 by Treacy M.M.J. (1980)
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10.1103/PhysRev.162.1439

Dates

Type	When
Created	14 years ago (Aug. 2, 2011, 11:37 a.m.)
Deposited	1 year, 10 months ago (Oct. 21, 2023, 6:44 p.m.)
Indexed	2 weeks, 2 days ago (Aug. 6, 2025, 7:58 a.m.)
Issued	38 years, 8 months ago (Dec. 1, 1986)
Published	38 years, 8 months ago (Dec. 1, 1986)
Published Online	14 years ago (Aug. 2, 2011)
Published Print	38 years, 8 months ago (Dec. 1, 1986)

Funders 0

None

BibTeX

@article{Pennycook_1986, title={Elemental mapping with elastically scattered electrons}, volume={144}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1986.tb02804.x}, DOI={10.1111/j.1365-2818.1986.tb02804.x}, number={3}, journal={Journal of Microscopy}, publisher={Wiley}, author={Pennycook, S. J. and Berger, S. D. and Culbertson, R. J.}, year={1986}, month=dec, pages={229–249} }

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