DOI: 10.1111/j.1365-2818.1986.tb02734.x. Rationale for the application of thin, continuous metal films in high magnification electron microscopy

Rationale for the application of thin, continuous metal films in high magnification electron microscopy

10.1111/j.1365-2818.1986.tb02734.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SUMMARYVarious metal films of different thicknesses were deposited on to a particle test specimen and their effects on topographic contrast generation and specimen preservation were determined. Tobacco mosaic virus adsorbed on to thin carbon supports or silicon chips was imaged in TEM or high resolution SE‐I SEM at a magnification of 350,000×. Tantalum films of 1–2 nm (average mass) thickness produced best contrasts and prevented volume loss of the particles from electron beam damage. Excessively thick films of 5–10 nm thickness blanketed fine structures and caused severe volume losses. Discontinuous 2 nm thick films of gold or platinum decorated the surfaces, caused a loss in topographic contrasts and induced very high volume losses. Thin continuous metal films were necessary to generate high topographic contrast and to prevent volume loss from beam damage by providing sufficient mechanical stability for small topographic features and increased thermal conductivity of the specimen surface.

Bibliography

Peters, K. (1986). Rationale for the application of thin, continuous metal films in high magnification electron microscopy. Journal of Microscopy, 142(1), 25â34. Portico.

Authors 1

Klaus‐Ruediger Peters (first)

References 42 Referenced 35

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{'key': 'e_1_2_1_23_1', 'first-page': '3', 'volume-title': 'Handbook of Thin Film Technology', 'author': 'Neugebauer C. A.', 'year': '1970'} / Handbook of Thin Film Technology by Neugebauer C. A. (1970)
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{'key': 'e_1_2_1_28_1', 'first-page': '143', 'article-title': 'Penning sputtering of ultra thin films for high resolution electron microscopy', 'author': 'Peters K.‐R.', 'year': '1980', 'journal-title': 'Scanning Electron Microscopy'} / Scanning Electron Microscopy / Penning sputtering of ultra thin films for high resolution electron microscopy by Peters K.‐R. (1980)
{'key': 'e_1_2_1_29_1', 'first-page': '1359', 'article-title': 'Conditions required for high quality high magnification images in secondary electron‐I scanning electron microscopy', 'author': 'Peters K.‐R.', 'year': '1982', 'journal-title': 'Scanning Electron Microscopy'} / Scanning Electron Microscopy / Conditions required for high quality high magnification images in secondary electron‐I scanning electron microscopy by Peters K.‐R. (1982)
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{'key': 'e_1_2_1_34_1', 'volume-title': 'Advanced Techniques in Biological Electron Microscopy III', 'author': 'Peters K.‐R.', 'year': '1985'} / Advanced Techniques in Biological Electron Microscopy III by Peters K.‐R. (1985)
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10.1063/1.1712962

Dates

Type	When
Created	14 years, 1 month ago (Aug. 2, 2011, 10:01 a.m.)
Deposited	1 year, 11 months ago (Sept. 26, 2023, 6:08 p.m.)
Indexed	1 year, 9 months ago (Nov. 15, 2023, 3:46 p.m.)
Issued	39 years, 5 months ago (April 1, 1986)
Published	39 years, 5 months ago (April 1, 1986)
Published Online	14 years, 1 month ago (Aug. 2, 2011)
Published Print	39 years, 5 months ago (April 1, 1986)

Funders 0

None

BibTeX

@article{Peters_1986, title={Rationale for the application of thin, continuous metal films in high magnification electron microscopy}, volume={142}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1986.tb02734.x}, DOI={10.1111/j.1365-2818.1986.tb02734.x}, number={1}, journal={Journal of Microscopy}, publisher={Wiley}, author={Peters, Klaus‐Ruediger}, year={1986}, month=apr, pages={25–34} }

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