Abstract
SUMMARYThere is renewed interest in the interaction of high energy electron beams with surfaces at glancing angles of incidence, due partially to recent improvements in, and consequential resurgence of, reflection electron microscopy. In this paper electron energy loss of beams running parallel to a surface or at glancing incidence to it are studied and compared with predictions arising from the classical theory of dielectric excitation by a moving charge. There is good agreement for both the Cu and MgO surfaces studied here. It is pointed out that small angle energy loss from high energy electrons is insensitive to surface reconstructions or surface steps. Reflection energy filtered micrographs of the Cu surface are shown and the similarity between the zero and various energy loss images shows the preservation of contrast mechanisms for elastic and inelastic electrons.
References
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Dates
Type | When |
---|---|
Created | 14 years ago (Aug. 2, 2011, noon) |
Deposited | 1 year, 4 months ago (April 9, 2024, 9:44 a.m.) |
Indexed | 1 month, 4 weeks ago (June 25, 2025, 4:47 p.m.) |
Issued | 40 years, 9 months ago (Nov. 1, 1984) |
Published | 40 years, 9 months ago (Nov. 1, 1984) |
Published Online | 14 years ago (Aug. 2, 2011) |
Published Print | 40 years, 9 months ago (Nov. 1, 1984) |
@article{Howie_1984, title={Electron energy loss spectra and reflection images from surfaces}, volume={136}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1984.tb00534.x}, DOI={10.1111/j.1365-2818.1984.tb00534.x}, number={2}, journal={Journal of Microscopy}, publisher={Wiley}, author={Howie, A. and Milne, R. H.}, year={1984}, month=nov, pages={279–285} }