Crossref journal-article
Wiley
Journal of Microscopy (311)
Abstract

SUMMARYRadiation damage to a biological specimen arises from a variety of interactions between the illuminating electrons and the atoms in it. The relative probabilities of these events, and the amount of energy transferred, can be calculated from basic physical theory. The microscopic damage caused in a particular specimen in given operating conditions is more difficult to predict, but it can be measured by a number of macroscopic indicators, the chief of which are loss of mass and changes in the energy loss spectrum (or electron diffraction pattern, if any). For most biological material the observed rate of damage is such as to set a limit to the intensity of illumination, the maximum magnification and the minimum size of detail that can be made visible. Several techniques have been devised and tested for reducing the radiation sensitivity of a specimen, of which cooling to a very low temperature and encasing it in an inert medium are the most effective. If the various protective measures act cooperatively, they could increase the effective resolution of sensitive material by an order of magnitude, making possible electron microscopy of the atomic structure of, for instance, the nucleic acid bases and other macromolecules. The prospects for observing living cells at a resolution better than that of the best optical microscopes would remain very small.

Bibliography

Cosslett, V. E. (1978). Radiation damage in the high resolution electron microscopy of biological materials: A review*. Journal of Microscopy, 113(2), 113–129. Portico.

Authors 1
  1. V. E. Cosslett (first)
References 53 Referenced 124
  1. {'key': 'e_1_2_1_2_1', 'first-page': '1115', 'article-title': 'The elementary composition of organic objects after electron irradiation', 'volume': '14', 'author': 'Bahr G. F.', 'year': '1965', 'journal-title': 'Lab. Invest.'} / Lab. Invest. / The elementary composition of organic objects after electron irradiation by Bahr G. F. (1965)
  2. 10.1016/S0006-3495(76)85729-3
  3. {'key': 'e_1_2_1_4_1', 'first-page': '247', 'article-title': 'An improved method for preparing single crystal specimen supports: H2O2 exfoliation of vermiculite', 'volume': '7', 'author': 'Baumeister W.', 'year': '1976', 'journal-title': 'Micron'} / Micron / An improved method for preparing single crystal specimen supports: H2O2 exfoliation of vermiculite by Baumeister W. (1976)
  4. {'key': 'e_1_2_1_5_1', 'first-page': '227', 'volume-title': 'Progress in Surface and Membrane Science', 'author': 'Baumeister W.', 'year': '1976'} / Progress in Surface and Membrane Science by Baumeister W. (1976)
  5. 10.1002/bbpc.19700741115 / Ber. Bunsenges. phys. chem. / Beam and specimen: radiation damage and image resolution by Cosslett V. E. (1970)
  6. {'key': 'e_1_2_1_7_1', 'first-page': '147', 'volume-title': 'High Voltage Electron Microscopy', 'author': 'Cosslett V. E.', 'year': '1974'} / High Voltage Electron Microscopy by Cosslett V. E. (1974)
  7. 10.1126/science.168.3937.1338
  8. 10.1016/S0304-3991(76)90365-X
  9. 10.1016/S0022-5320(75)80118-3
  10. 10.1080/14786437508229296
  11. 10.1111/j.1365-2818.1973.tb03782.x
  12. {'key': 'e_1_2_1_13_1', 'first-page': '678', 'volume-title': 'Electron Microscopy', 'author': 'Frank J.', 'year': '1974'} / Electron Microscopy by Frank J. (1974)
  13. 10.1016/S0022-5320(71)80118-1
  14. {'key': 'e_1_2_1_15_1', 'first-page': '205', 'volume-title': 'Physical Aspects of Electron Microscopy and Microbeam Analysis', 'author': 'Glaeser R. M.', 'year': '1975'} / Physical Aspects of Electron Microscopy and Microbeam Analysis by Glaeser R. M. (1975)
  15. 10.1080/14786437108217051
  16. {'key': 'e_1_2_1_17_1', 'first-page': '554', 'volume-title': 'Electron Microscopy', 'author': 'Grubb D. T.', 'year': '1972'} / Electron Microscopy by Grubb D. T. (1972)
  17. {'key': 'e_1_2_1_18_1', 'first-page': '672', 'volume-title': 'Electron Microscopy 1974', 'author': 'Hahn M.', 'year': '1974'} / Electron Microscopy 1974 by Hahn M. (1974)
  18. 10.1111/j.1365-2818.1974.tb03927.x
  19. 10.1126/science.188.4195.1304
  20. 10.1143/JPSJ.42.1073
  21. {'key': 'e_1_2_1_22_1', 'first-page': '123', 'article-title': 'Visualization of single atoms in molecules and crystals by dark field electron microscopy', 'volume': '22', 'author': 'Hashimoto H.', 'year': '1973', 'journal-title': 'J. Electron. Microsc.'} / J. Electron. Microsc. / Visualization of single atoms in molecules and crystals by dark field electron microscopy by Hashimoto H. (1973)
  22. 10.1515/zna-1975-0913 / Z. Naturforsch. / Principles of trace structure analysis in electron microscopy by Hoppe W. (1975)
  23. Hoppe W.(1976)Proc. EMBO Workshop ‘Unconventional electron microscopical methods for the investigation of molecular structures’ Alpbach 1976 (in press).
  24. 10.1016/S0022-5320(76)80100-1
  25. {'key': 'e_1_2_1_26_1', 'first-page': '680', 'volume-title': 'Electron Microscopy 1974', 'author': 'Isaacson M.', 'year': '1974'} / Electron Microscopy 1974 by Isaacson M. (1974)
  26. 10.1063/1.1677456
  27. {'key': 'e_1_2_1_28_1', 'first-page': '247', 'volume-title': 'Physical Aspects of Electron Microscopy and Microbeam Analysis', 'author': 'Isaacson M.', 'year': '1975'} / Physical Aspects of Electron Microscopy and Microbeam Analysis by Isaacson M. (1975)
  28. {'key': 'e_1_2_1_29_1', 'first-page': '1', 'volume-title': 'Principles and Techniques of Electron Microscopy', 'author': 'Isaacson M.', 'year': '1977'} / Principles and Techniques of Electron Microscopy by Isaacson M. (1977)
  29. {'key': 'e_1_2_1_30_1', 'first-page': '75', 'volume-title': 'Microscopie Électronique à Haute Tension', 'author': 'King M. V.', 'year': '1975'} / Microscopie Électronique à Haute Tension by King M. V. (1975)
  30. 10.1016/S0304-3991(76)92150-1
  31. King M. V.&Parsons D. F.(1977b)Structure of photographic images taken in the high voltage electron microscope.Proc. 5th Int. Conf. High Voltage Electron Microscopy Kyoto(in press).
  32. {'key': 'e_1_2_1_33_1', 'first-page': '579', 'volume-title': 'Proc. 6th Int. Congr. Elect. Microscopy, Kyoto', 'author': 'Kobayashi K.', 'year': '1966'} / Proc. 6th Int. Congr. Elect. Microscopy, Kyoto by Kobayashi K. (1966)
  33. {'key': 'e_1_2_1_34_1', 'first-page': '1097', 'article-title': 'Irradiation changes in organic polymers at various accelerating voltages', 'volume': '14', 'author': 'Kobayashi K.', 'year': '1965', 'journal-title': 'Lab. Invest.'} / Lab. Invest. / Irradiation changes in organic polymers at various accelerating voltages by Kobayashi K. (1965)
  34. {'key': 'e_1_2_1_35_1', 'first-page': '682', 'volume-title': 'Electron Microscopy 1974', 'author': 'Kobayashi T.', 'year': '1974'} / Electron Microscopy 1974 by Kobayashi T. (1974)
  35. 10.1016/S0304-3991(75)80007-6
  36. {'key': 'e_1_2_1_37_1', 'first-page': '526', 'article-title': 'Evaluation of emulsions and other recording media for 100 and 1000 kV electron microscopes', 'volume': '3', 'author': 'Matricardi V.', 'year': '1972', 'journal-title': 'Micron'} / Micron / Evaluation of emulsions and other recording media for 100 and 1000 kV electron microscopes by Matricardi V. (1972)
  37. 10.1088/0022-3727/10/8/007
  38. {'key': 'e_1_2_1_39_1', 'first-page': '379', 'volume-title': 'High Voltage Electron Microscopy', 'author': 'Nagata F.', 'year': '1974'} / High Voltage Electron Microscopy by Nagata F. (1974)
  39. 10.1126/science.186.4162.407
  40. {'key': 'e_1_2_1_41_1', 'first-page': '560', 'volume-title': 'Proc. 35th Annual Meeting Electron Microscopy Society of America', 'author': 'Ramamurti K.', 'year': '1977'} / Proc. 35th Annual Meeting Electron Microscopy Society of America by Ramamurti K. (1977)
  41. {'key': 'e_1_2_1_42_1', 'first-page': '231', 'volume-title': 'Physical Aspects of Electron Microscopy and Microbeam Analysis', 'author': 'Reimer L.', 'year': '1975'} / Physical Aspects of Electron Microscopy and Microbeam Analysis by Reimer L. (1975)
  42. Salih S. M.(1975)Radiation damage in organic materials in transmission electron microscopy. Ph.D. dissertation Cambridge.
  43. 10.1080/14786439808206550
  44. {'key': 'e_1_2_1_45_1', 'first-page': '670', 'volume-title': 'Electron Microscopy 1974', 'author': 'Salih S. M.', 'year': '1974'} / Electron Microscopy 1974 by Salih S. M. (1974)
  45. 10.1111/j.1365-2818.1975.tb04059.x
  46. 10.1515/zna-1972-0219 / Z. Naturforsch. / The influence of low temperatures on the radiation damage of organic crystals by 100 keV electrons by Siegel G. (1972)
  47. 10.1016/S0022-5320(70)90167-X
  48. 10.1016/S0022-5320(76)80099-8
  49. 10.1080/00337577008235620
  50. {'key': 'e_1_2_1_51_1', 'author': 'Tung C. J.', 'year': '1978', 'journal-title': 'Phys. Rev. B'} / Phys. Rev. B by Tung C. J. (1978)
  51. 10.1016/0022-2836(75)90212-0
  52. {'key': 'e_1_2_1_53_1', 'first-page': '566', 'volume-title': 'Electron Microscopy 1972', 'author': 'Uyeda N.', 'year': '1972'} / Electron Microscopy 1972 by Uyeda N. (1972)
  53. 10.1016/0022-2836(70)90181-6
Dates
Type When
Created 14 years ago (Aug. 2, 2011, 9:44 a.m.)
Deposited 1 year, 4 months ago (April 9, 2024, 9:37 a.m.)
Indexed 2 weeks, 6 days ago (Aug. 2, 2025, 1:01 a.m.)
Issued 47 years, 1 month ago (July 1, 1978)
Published 47 years, 1 month ago (July 1, 1978)
Published Online 14 years ago (Aug. 2, 2011)
Published Print 47 years, 1 month ago (July 1, 1978)
Funders 0

None

@article{Cosslett_1978, title={Radiation damage in the high resolution electron microscopy of biological materials: A review*}, volume={113}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1978.tb02454.x}, DOI={10.1111/j.1365-2818.1978.tb02454.x}, number={2}, journal={Journal of Microscopy}, publisher={Wiley}, author={Cosslett, V. E.}, year={1978}, month=jul, pages={113–129} }