DOI: 10.1111/j.1365-2818.1973.tb03765.x. High voltage electron transmission microscopy of pyrolytic silicon carbide coatings from nuclear fuel particles

High voltage electron transmission microscopy of pyrolytic silicon carbide coatings from nuclear fuel particles

10.1111/j.1365-2818.1973.tb03765.x

Crossref journal-article

Wiley

Journal of Microscopy (311)

Abstract

SUMMARYOne design concept for a gas cooled fast reactor fuel element utilizes directly cooled coated fuel particles. The fission product retention barrier is a pyrolytic SiC layer approximately 50 μm thick and 1 mm diameter. Knowledge of the structure of this material and its irradiation performance after high neutron doses is vital to the success of such reactors.Specimens oriented both parallel and perpendicular to the radius can be prepared from the shells by ion beam sputtering. The defect structure and preferred orientation of the coatings is being investigated. The high voltage electron beam is being utilized to measure the atomic displacement energy and to simulate fast neutron damage at temperatures relevant to reactor conditions.

Bibliography

Hudson, B., & Sheldon, B. E. (1973). High voltage electron transmission microscopy of pyrolytic silicon carbide coatings from nuclear fuel particles. Journal of Microscopy, 97(1â2), 113â119. Portico.

Authors 2

B. Hudson (first)
B. E. Sheldon (additional)

References 15 Referenced 16

{'key': 'e_1_2_1_2_1', 'volume-title': 'ASTM Summer Meeting', 'year': '1972'} / ASTM Summer Meeting (1972)
{'key': 'e_1_2_1_3_1', 'volume-title': 'BNES Conf.', 'year': '1971'} / BNES Conf. (1971)
{'key': 'e_1_2_1_4_1', 'first-page': '439', 'article-title': 'Luminescence centres in irradiated β‐SiC', 'volume': '5', 'author': 'Geitsii I.I.', 'year': '1971', 'journal-title': 'Sov. Phys. Semicond.'} / Sov. Phys. Semicond. / Luminescence centres in irradiated β‐SiC by Geitsii I.I. (1971)
10.1103/PhysRev.143.623
{'key': 'e_1_2_1_6_1', 'volume-title': 'Int. Conf. Radiat. Damage in Semiconductors.', 'author': 'Hart R.R.', 'year': '1970'} / Int. Conf. Radiat. Damage in Semiconductors. by Hart R.R. (1970)
{'key': 'e_1_2_1_7_1', 'first-page': 'R7116', 'article-title': 'A transmission electron microscopic study of pyrolytic and self bonded silicon carbide', 'author': 'Hudson B.', 'year': '1972', 'journal-title': 'AERE Report'} / AERE Report / A transmission electron microscopic study of pyrolytic and self bonded silicon carbide by Hudson B. (1972)
10.1143/JPSJ.31.1761
{'key': 'e_1_2_1_9_1', 'first-page': '249', 'volume-title': 'Proc. Int. Conf. on SiC', 'author': 'Loubser J.H.N.', 'year': '1968'} / Proc. Int. Conf. on SiC by Loubser J.H.N. (1968)
{'key': 'e_1_2_1_10_1', 'first-page': '509', 'article-title': 'Studies of irradiation damage in the high voltage electron microscope', 'volume': '155', 'author': 'Makin M.J.', 'year': '1971', 'journal-title': 'Jernkont, Annl.'} / Jernkont, Annl. / Studies of irradiation damage in the high voltage electron microscope by Makin M.J. (1971)
{'key': 'e_1_2_1_11_1', 'first-page': '6957', 'article-title': 'The use of the Harwell high voltage microscope for quantitative void studies', 'author': 'Makin M.J.', 'year': '1971', 'journal-title': 'AERE Report, R'} / AERE Report, R / The use of the Harwell high voltage microscope for quantitative void studies by Makin M.J. (1971)
Matthews M.D.&Ashby S.(1972) Private communication.
10.1103/PhysRev.74.1759
Nelson R.S.(1972) Private communication.
{'key': 'e_1_2_1_15_1', 'volume-title': 'Radiation induced voids in metals', 'author': 'USAEC Conf.', 'year': '1971'} / Radiation induced voids in metals by USAEC Conf. (1971)
Worth J.H.(1972) Private communication.

Dates

Type	When
Created	14 years ago (Aug. 2, 2011, 12:18 p.m.)
Deposited	2 years ago (Aug. 31, 2023, 3:28 a.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 11:10 a.m.)
Issued	52 years, 7 months ago (Jan. 3, 1973)
Published	52 years, 7 months ago (Jan. 3, 1973)
Published Online	14 years ago (Aug. 2, 2011)
Published Print	52 years, 7 months ago (Jan. 3, 1973)

Funders 0

None

BibTeX

@article{Hudson_1973, title={High voltage electron transmission microscopy of pyrolytic silicon carbide coatings from nuclear fuel particles}, volume={97}, ISSN={1365-2818}, url={http://dx.doi.org/10.1111/j.1365-2818.1973.tb03765.x}, DOI={10.1111/j.1365-2818.1973.tb03765.x}, number={1–2}, journal={Journal of Microscopy}, publisher={Wiley}, author={Hudson, B. and Sheldon, B. E.}, year={1973}, month=jan, pages={113–119} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        10
      ]
    ],
    "date-time": "2024-02-10T16:10:11Z",
    "timestamp": 1707581411600
  },
  "reference-count": 15,
  "publisher": "Wiley",
  "issue": "1-2",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2011,
            8,
            2
          ]
        ],
        "date-time": "2011-08-02T00:00:00Z",
        "timestamp": 1312243200000
      },
      "content-version": "vor",
      "delay-in-days": 14090,
      "URL": "http://onlinelibrary.wiley.com/termsAndConditions#vor"
    }
  ],
  "content-domain": {
    "domain": [
      "onlinelibrary.wiley.com"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1973,
        1,
        3
      ]
    ]
  },
  "abstract": "<jats:title>SUMMARY</jats:title><jats:p>One design concept for a gas cooled fast reactor fuel element utilizes directly cooled coated fuel particles. The fission product retention barrier is a pyrolytic SiC layer approximately 50 \u03bcm thick and 1 mm diameter. Knowledge of the structure of this material and its irradiation performance after high neutron doses is vital to the success of such reactors.</jats:p><jats:p>Specimens oriented both parallel and perpendicular to the radius can be prepared from the shells by ion beam sputtering. The defect structure and preferred orientation of the coatings is being investigated. The high voltage electron beam is being utilized to measure the atomic displacement energy and to simulate fast neutron damage at temperatures relevant to reactor conditions.</jats:p>",
  "DOI": "10.1111/j.1365-2818.1973.tb03765.x",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2011,
        8,
        2
      ]
    ],
    "date-time": "2011-08-02T16:18:03Z",
    "timestamp": 1312301883000
  },
  "page": "113-119",
  "update-policy": "http://dx.doi.org/10.1002/crossmark_policy",
  "source": "Crossref",
  "is-referenced-by-count": 16,
  "title": "High voltage electron transmission microscopy of pyrolytic silicon carbide coatings from nuclear fuel particles",
  "prefix": "10.1111",
  "volume": "97",
  "author": [
    {
      "given": "B.",
      "family": "Hudson",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "B. E.",
      "family": "Sheldon",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "311",
  "published-online": {
    "date-parts": [
      [
        2011,
        8,
        2
      ]
    ]
  },
  "reference": [
    {
      "key": "e_1_2_1_2_1",
      "volume-title": "ASTM Summer Meeting",
      "year": "1972"
    },
    {
      "key": "e_1_2_1_3_1",
      "volume-title": "BNES Conf.",
      "year": "1971"
    },
    {
      "key": "e_1_2_1_4_1",
      "first-page": "439",
      "article-title": "Luminescence centres in irradiated \u03b2\u2010SiC",
      "volume": "5",
      "author": "Geitsii I.I.",
      "year": "1971",
      "journal-title": "Sov. Phys. Semicond."
    },
    {
      "key": "e_1_2_1_5_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRev.143.623"
    },
    {
      "key": "e_1_2_1_6_1",
      "volume-title": "Int. Conf. Radiat. Damage in Semiconductors.",
      "author": "Hart R.R.",
      "year": "1970"
    },
    {
      "key": "e_1_2_1_7_1",
      "first-page": "R7116",
      "article-title": "A transmission electron microscopic study of pyrolytic and self bonded silicon carbide",
      "author": "Hudson B.",
      "year": "1972",
      "journal-title": "AERE Report"
    },
    {
      "key": "e_1_2_1_8_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1143/JPSJ.31.1761"
    },
    {
      "key": "e_1_2_1_9_1",
      "first-page": "249",
      "volume-title": "Proc. Int. Conf. on SiC",
      "author": "Loubser J.H.N.",
      "year": "1968"
    },
    {
      "key": "e_1_2_1_10_1",
      "first-page": "509",
      "article-title": "Studies of irradiation damage in the high voltage electron microscope",
      "volume": "155",
      "author": "Makin M.J.",
      "year": "1971",
      "journal-title": "Jernkont, Annl."
    },
    {
      "key": "e_1_2_1_11_1",
      "first-page": "6957",
      "article-title": "The use of the Harwell high voltage microscope for quantitative void studies",
      "author": "Makin M.J.",
      "year": "1971",
      "journal-title": "AERE Report, R"
    },
    {
      "key": "e_1_2_1_12_1",
      "unstructured": "Matthews M.D.&Ashby S.(1972) Private communication."
    },
    {
      "key": "e_1_2_1_13_1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRev.74.1759"
    },
    {
      "key": "e_1_2_1_14_1",
      "unstructured": "Nelson R.S.(1972) Private communication."
    },
    {
      "key": "e_1_2_1_15_1",
      "volume-title": "Radiation induced voids in metals",
      "author": "USAEC Conf.",
      "year": "1971"
    },
    {
      "key": "e_1_2_1_16_1",
      "unstructured": "Worth J.H.(1972) Private communication."
    }
  ],
  "container-title": "Journal of Microscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1111%2Fj.1365-2818.1973.tb03765.x",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://onlinelibrary.wiley.com/doi/pdf/10.1111/j.1365-2818.1973.tb03765.x",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        8,
        31
      ]
    ],
    "date-time": "2023-08-31T07:28:04Z",
    "timestamp": 1693466884000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://onlinelibrary.wiley.com/doi/10.1111/j.1365-2818.1973.tb03765.x"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1973,
        1,
        3
      ]
    ]
  },
  "references-count": 15,
  "journal-issue": {
    "issue": "1-2",
    "published-print": {
      "date-parts": [
        [
          1973,
          1,
          3
        ]
      ]
    }
  },
  "alternative-id": [
    "10.1111/j.1365-2818.1973.tb03765.x"
  ],
  "URL": "http://dx.doi.org/10.1111/j.1365-2818.1973.tb03765.x",
  "relation": {},
  "ISSN": [
    "0022-2720",
    "1365-2818"
  ],
  "subject": [],
  "container-title-short": "Journal of Microscopy",
  "published": {
    "date-parts": [
      [
        1973,
        1,
        3
      ]
    ]
  },
  "assertion": [
    {
      "value": "2011-08-02",
      "order": 2,
      "name": "published",
      "label": "Published",
      "group": {
        "name": "publication_history",
        "label": "Publication History"
      }
    }
  ]
}