DOI: 10.1111/j.1151-2916.2001.tb00950.x. Electrical Conductivity and Lattice Defects in Nanocrystalline Cerium Oxide Thin Films

Electrical Conductivity and Lattice Defects in Nanocrystalline Cerium Oxide Thin Films

10.1111/j.1151-2916.2001.tb00950.x

Crossref journal-article

Wiley

Journal of the American Ceramic Society (311)

Abstract

The results of the electrical conductivity and Raman scattering measurements of CeO2 thin films obtained by a polymeric precursor spin‐coating technique are presented. The electrical conductivity has been studied as a function of temperature and oxygen activity and correlated with the grain size. When compared with microcrystalline samples, nanocrystalline materials show enhanced electronic conductivity. The transition from extrinsic to intrinsic type of conductivity has been observed as the grain size decreases to <100 nm, which appears to be related to a decrease in the enthalpy of oxygen vacancy formation in CeO2. Raman spectroscopy has been used to analyze the crystalline quality as a function of grain size. A direct comparison has been made between the defect concentration calculated from coherence length and nonstoichiometry determined from electrical measurements.

Bibliography

Suzuki, T., Kosacki, I., Anderson, H. U., & Colomban, P. (2001). Electrical Conductivity and Lattice Defects in Nanocrystalline Cerium Oxide Thin Films. Journal of the American Ceramic Society, 84(9), 2007â2014. Portico.

Authors 4

Toshio Suzuki (first)
Igor Kosacki (additional)
Harlan U. Anderson (additional)
Philippe Colomban (additional)

References 32 Referenced 180

{'key': 'e_1_2_1_2_2', 'first-page': '275', 'volume-title': 'Ceramic Transactions', 'author': 'Kosacki I.', 'year': '2000'} / Ceramic Transactions by Kosacki I. (2000)
10.1016/S0167-2738(97)00078-7
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10.1016/0022-3697(75)90192-4
10.1557/PROC-453-537
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{'key': 'e_1_2_1_8_2', 'first-page': '448', 'volume-title': 'Ionic and Mixed Conducting Ceramics, Proceedings of the 2nd International Symposium', 'author': 'Mogensen M.', 'year': '1994'} / Ionic and Mixed Conducting Ceramics, Proceedings of the 2nd International Symposium by Mogensen M. (1994)
{'issue': '24', 'key': 'e_1_2_1_9_2', 'first-page': '631', 'article-title': 'Microstructure and Electrical Conductivity in Nanocrystalline Oxide Thin Films', 'volume': '97', 'author': 'Kosacki I.', 'year': '1998', 'journal-title': 'Electrochem. Soc. Proc.'} / Electrochem. Soc. Proc. / Microstructure and Electrical Conductivity in Nanocrystalline Oxide Thin Films by Kosacki I. (1998)
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H. U.Anderson M. M.Nasrallah andC. C.Chen “Method of Coating a Substrate with a Metal Oxide Film from an Aqueous Solution Comprising a Metal Cation and a Polymerizable Organic Solvent ” U.S. Pat. No. 5 494 700 (1996).
{'issue': '13', 'key': 'e_1_2_1_16_2', 'first-page': '190', 'article-title': 'Nanocrystalline Oxide Thin Films for Electrochemical Devices', 'volume': '99', 'author': 'Kosacki I.', 'year': '1999', 'journal-title': 'Electrochem. Soc. Proc.'} / Electrochem. Soc. Proc. / Nanocrystalline Oxide Thin Films for Electrochemical Devices by Kosacki I. (1999)
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I.Kosacki A.Vertegel T.Suzuki andH. U. Anderson unpublished work.
{'key': 'e_1_2_1_20_2', 'volume-title': 'Elements of X‐ray Diffraction', 'author': 'Cullity B. D.', 'year': '1959'} / Elements of X‐ray Diffraction by Cullity B. D. (1959)
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I.Kosacki T.Suzuki V.Petrovsky H. U.Anderson andP.Colomban “Raman Scattering and Lattice Defects in Nanocrystalline CeO2Thin Films ”Appl. Phys. Lett. in review.
10.1557/PROC-457-99
10.1524/zpch.1998.207.Part_1_2.021

Dates

Type	When
Created	15 years, 1 month ago (July 24, 2010, 8:03 a.m.)
Deposited	1 year, 9 months ago (Nov. 22, 2023, 9:20 p.m.)
Indexed	5 days, 22 hours ago (Aug. 20, 2025, 8:54 a.m.)
Issued	23 years, 11 months ago (Sept. 1, 2001)
Published	23 years, 11 months ago (Sept. 1, 2001)
Published Online	20 years, 8 months ago (Dec. 20, 2004)
Published Print	23 years, 11 months ago (Sept. 1, 2001)

Funders 0

None

BibTeX

@article{Suzuki_2001, title={Electrical Conductivity and Lattice Defects in Nanocrystalline Cerium Oxide Thin Films}, volume={84}, ISSN={1551-2916}, url={http://dx.doi.org/10.1111/j.1151-2916.2001.tb00950.x}, DOI={10.1111/j.1151-2916.2001.tb00950.x}, number={9}, journal={Journal of the American Ceramic Society}, publisher={Wiley}, author={Suzuki, Toshio and Kosacki, Igor and Anderson, Harlan U. and Colomban, Philippe}, year={2001}, month=sep, pages={2007–2014} }

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