Abstract
Resistance degradation in perovskites generally is assumed to be caused by stoichiometry variations that occur during high field stress. According to this assumption, distinct conductivity profiles should develop during degradation. In this study, microcontact impedance spectroscopy is used to determine the conductivity profiles in iron‐doped strontium titanate after dc stress with a spatial resolution of ∼20 μm. All the features of the characteristic conductivity distributions experimentally observed in single crystals agree with the theoretically predicted distributions and confirm the validity of the stoichiometry polarization model. The degraded samples are concluded to exhibit an oxygen‐vacancy enhancement at the cathode and a vacancy depletion at the anode, which leads to a hole–ionic–electron conduction (p–v–n) transition of the conduction mechanism. Conductivity measurements at polycrystals revealed “subprofiles” within single grains, which can be explained by the blocking character of grain boundaries and the resulting accumulation of vacancies on one side of the grain boundaries and a depletion of vacancies on the other side.
References
29
Referenced
86
{'key': 'e_1_2_1_2_2', 'first-page': '338', 'article-title': 'Ceramic Boundary‐Layer Capacitors', 'volume': '41', 'author': 'Mauczok R.', 'year': '1983', 'journal-title': 'Philips Technol. Rev.'}
/ Philips Technol. Rev. / Ceramic Boundary‐Layer Capacitors by Mauczok R. (1983){'key': 'e_1_2_1_3_2', 'first-page': '73', 'article-title': 'The PTC Effect of Barium Titanate', 'volume': '38', 'author': 'Daniels J.', 'year': '1978', 'journal-title': 'Philips Technol. Rev.'}
/ Philips Technol. Rev. / The PTC Effect of Barium Titanate by Daniels J. (1978)10.1016/0925-4005(91)80183-K
10.1002/bbpc.198800361
10.1111/j.1151-2916.1990.tb09809.x
10.1111/j.1151-2916.1990.tb09810.x
10.1111/j.1151-2916.1990.tb09811.x
10.1103/PhysRevB.4.3548
10.1007/BF02396925
10.1063/1.331538
10.1080/00150198608008191
10.1111/j.1151-2916.1980.tb10654.x
10.1063/1.1728890
10.1111/j.1151-2916.1963.tb19771.x
10.1016/0167-2738(96)00035-5
10.1039/a902839k
10.1063/1.372189
10.1016/S0955-2219(98)00317-3
10.1016/0167-2738(86)90031-7
10.1149/1.1838044
10.1007/978-3-662-06688-1
10.1143/JPSJ.16.2213
{'issue': '143', 'key': 'e_1_2_1_24_2', 'article-title': 'Ein Modell zur Beschreibung des Degradationsverhaltens von SrTiO3–Keramiken und‐Einkristallen unter Elektrischer Gleichspannungsbelastung', 'volume': '34', 'author': 'Baiatu T.', 'year': '1988', 'journal-title': 'Fortschr. Ber. Z. Reihe 5'}
/ Fortschr. Ber. Z. Reihe 5 / Ein Modell zur Beschreibung des Degradationsverhaltens von SrTiO3–Keramiken und‐Einkristallen unter Elektrischer Gleichspannungsbelastung by Baiatu T. (1988)10.1103/PhysRevB.4.3623
10.1111/j.1151-2916.1995.tb07963.x
10.1111/j.1151-2916.1997.tb02827.x
/ J. Am. Ceram. Soc. / In‐Situ Profiles of Oxygen Diffusion in SrTiO3: Bulk Behavior and Boundary Effects by Denk I. (1997)10.1111/j.1151-2916.1997.tb03121.x
10.1149/1.1390827
10.1111/j.1151-2916.1997.tb03157.x
Dates
Type | When |
---|---|
Created | 15 years, 1 month ago (July 24, 2010, 8:13 a.m.) |
Deposited | 1 year, 5 months ago (March 28, 2024, 2:08 p.m.) |
Indexed | 2 days, 15 hours ago (Aug. 27, 2025, 12:27 p.m.) |
Issued | 25 years ago (Aug. 1, 2000) |
Published | 25 years ago (Aug. 1, 2000) |
Published Online | 20 years, 8 months ago (Dec. 20, 2004) |
Published Print | 25 years ago (Aug. 1, 2000) |
@article{Rodewald_2000, title={Resistance Degradation of Iron‐Doped Strontium Titanate Investigated by Spatially Resolved Conductivity Measurements}, volume={83}, ISSN={1551-2916}, url={http://dx.doi.org/10.1111/j.1151-2916.2000.tb01499.x}, DOI={10.1111/j.1151-2916.2000.tb01499.x}, number={8}, journal={Journal of the American Ceramic Society}, publisher={Wiley}, author={Rodewald, Stefan and Fleig, Jürgen and Maier, Joachim}, year={2000}, month=aug, pages={1969–1976} }