DOI: 10.1111/j.1151-2916.1990.tb05298.x. Impurity Distribution in Polycrystalline Aluminum Nitride Ceramics

Impurity Distribution in Polycrystalline Aluminum Nitride Ceramics

10.1111/j.1151-2916.1990.tb05298.x

Crossref journal-article

Wiley

Journal of the American Ceramic Society (311)

Abstract

Convergent‐beam electron diffraction and diffuse darkfield imaging of transmission electron microscopy were used to obtain qualitative information regarding the distribution of impurities in polycrystalline AIN. Impurities are distributed homogeneously within the grains of a given ceramic, but an amorphous grain‐boundary phase on the order of 1 to 2 nm in thickness is observed between the AIN matrix grains.

Bibliography

Callahan, D. L., & Thomas, G. (1990). Impurity Distribution in Polycrystalline Aluminum Nitride Ceramics. Journal of the American Ceramic Society, 73(7), 2167â2170. Portico.

Authors 2

Daniel L. Callahan (first)
Gareth Thomas (additional)

References 15 Referenced 22

10.1016/0022-3697(73)90092-9
10.1016/0022-0248(77)90246-9
10.1007/BF00586311
10.1111/j.1151-2916.1983.tb10029.x
10.1007/BF00720974
10.1016/0022-3697(87)90153-3
10.1016/0022-0248(76)90139-1
{'key': 'e_1_2_1_9_2', 'first-page': '430', 'volume-title': 'Proceedings of the 47th Annual Meeting of the Electron Microscopy Society of America', 'author': 'Callahan D.', 'year': '1989'} / Proceedings of the 47th Annual Meeting of the Electron Microscopy Society of America by Callahan D. (1989)
{'key': 'e_1_2_1_10_2', 'first-page': '399', 'volume-title': 'Ceramic Transactions', 'author': 'Youngman R. A.', 'year': '1989'} / Ceramic Transactions by Youngman R. A. (1989)
{'key': 'e_1_2_1_11_2', 'first-page': '403', 'volume-title': 'Introduction to Analytical Electron Microscopy', 'author': 'Steeds J. W.', 'year': '1979'} / Introduction to Analytical Electron Microscopy by Steeds J. W. (1979)
{'key': 'e_1_2_1_12_2', 'first-page': '121', 'volume-title': 'Practical Analytical Electron Microscopy in Materials Science', 'author': 'Williams D. B.', 'year': '1987'} / Practical Analytical Electron Microscopy in Materials Science by Williams D. B. (1987)
10.1063/1.326453
10.1111/j.1151-2916.1979.tb12737.x
{'key': 'e_1_2_1_15_2', 'first-page': '567', 'volume-title': 'Proceedings of the 46th Annual Meeting of the Electron Microscopy Society of America', 'author': 'Youngman R. A.', 'year': '1988'} / Proceedings of the 46th Annual Meeting of the Electron Microscopy Society of America by Youngman R. A. (1988)
R. A.Youngman J. H.Harris P. A.Labun R. J.Graham andJ. K.Weiss “Inversion Domain Boundaries and Oxygen Accommodation in Aluminum Nitride”; to be published in Proceedings of the Materials Research Society: Symposium on Advanced Electronic Packaging Materials Boston MA 1989. (10.1557/PROC-167-271)

Dates

Type	When
Created	20 years, 5 months ago (March 8, 2005, 12:32 p.m.)
Deposited	1 year, 9 months ago (Nov. 22, 2023, 7:34 p.m.)
Indexed	1 month, 3 weeks ago (July 13, 2025, 10:38 p.m.)
Issued	35 years, 2 months ago (July 1, 1990)
Published	35 years, 2 months ago (July 1, 1990)
Published Online	20 years, 5 months ago (March 8, 2005)
Published Print	35 years, 2 months ago (July 1, 1990)

Funders 0

None

BibTeX

@article{Callahan_1990, title={Impurity Distribution in Polycrystalline Aluminum Nitride Ceramics}, volume={73}, ISSN={1551-2916}, url={http://dx.doi.org/10.1111/j.1151-2916.1990.tb05298.x}, DOI={10.1111/j.1151-2916.1990.tb05298.x}, number={7}, journal={Journal of the American Ceramic Society}, publisher={Wiley}, author={Callahan, Daniel L. and Thomas, Gareth}, year={1990}, month=jul, pages={2167–2170} }

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